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21篇 您的检索式：作者名="RAMMINGER S"

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	题名	作者	年代	出处	被引量
1	Reliability Model for AI Wire Bonds subjected to Heel Crack Failures显示文摘	RAMMINGER S SELIGER N Wachutka G	2000	Microelectronics Reliability2000，40，：	1
2	Reliability model for A1 wire bonds subjected to heel crack failures显示文摘	Ramminger S Seliger N Wachutka G	2000	Microelectronics Reliability2000，40，8：	1
3	Reliability model for Al wire bonds subjected to heel crack failures显示文摘	RAMMINGER S SELIGER N WACHUTKA G	2000	Microelectronics Reliability2000，40，9：	1
4	Reliability model for Al wire bonds subjected to heel crack failures显示文摘	Ramminger S Seliger N Wachutka G	2000	Microelectroni s Reliability2000，40，：	1
5	Crack mechanism in wire bonding joints显示文摘	RAMMINGER S TUKES P WACHUTKA G		0，，：	1
6	Reliability model for A1 wire bonds subjected to heel crack failures显示文摘	RAMMINGER S SELIGERN WACHUTKA G	2000	2000，，：	1
7	Reliability model for Al wire bonds subjected to heel crack failures显示文摘	RAMMINGER S SELIGER N WACHUTKA G	2000	Microelectronics Reliability2000，40，10：	1
8	Reliability model for A1 wire bonds subjected to heel crack failures 显示文摘	Ramminger S Seliger N Wachutka G	2000	Microelectronics Reliability2000，40，9：	1
9	Reliability model for Al wire bonds subjected to heel crack failures显示文摘	RAMMINGER S SELIGER N WACHUTKA G	2000	Microelectronics Reliability2000，40，8：	1
10	A facile synthesis of ilarge extraannular - functionalized phenyl- ethynyl macrocycles containing m -terphenyl Units显示文摘	HOGER S ROSSELLI S RAMMINGER A D	2002	Org Lett2002，4，：	1
11	The relationship of fluid balance and sodium administration to cerebral edema formation and intracranial pressure in a model of brain显示文摘	Ramming S Shackford S R Zhuang J		0，，25：	1
12	Reliability model for A1 wire bonds subjected to heel crack failures 显示文摘	Ramminger S Seliger N	2000	Microelectron Reliab2000，40，：	1
13	Crack mechanism in wire bonding joinls显示文摘	Ramminger S Turkes P Wachulka G	1998	Microeleetronies and Reliability1998，38，：	1
14	Reliability model for al wire bonds subjected to heel crack failures显示文摘	Ramminger S Seliger N Wachutka G	2000	Microelectronics Reliability2000，40，：	1
15	Crack mechanism in wire bonding joints显示文摘	13 S RAMMINGER TURKES P	1998	Microelectronics reliability1998，38，：	1
16	Dis- cotic liquid crystals with an inverted structure 显示文摘	Hoger S Cheng X H Ramminger A D	2005	Angew Chem Int Edit2005，44，：	1
17	O2 can raise fetal pneumocyte Na^+ conductance without affecting ENaC mRNA abundance显示文摘	Richard K Ramminger S J Inglis S K	2003	Biochem Biophys Res Commun2003，305，3：	1
18	Reliability Model for Al Wire Bonds Subjected to Heel Crack Failures显示文摘	RAMMINGER S SELIGER N WACHUTKA G	2000	Microelectronics Reliability2000，40，：	1
19	Crack mechanism in wire bonding joints显示文摘	RAMMINGER S TURKES P WACHUTKA G	1998	Microelectronics Reliability1998，38，：	1
20	Reliability model for Al wire bonds subjected to heel crack failures显示文摘	RAMMINGER S SELIGER N WACHUTKA G	2000	Microelectronics Reliability2000，40，8：	1

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