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335篇 您的检索式：期刊名="Microelectron Reliab"

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	题名	作者	年代	出处	被引量
1	An integro-differential equation related to gaver's parallel system显示文摘	Vanderperre E J	1995	Microelectron Reliab1995，35，1：	1
2	Common-cause failure analysis of a parallel system with warm standby显示文摘	Dhilon B S Anude O C	1993	Microelectron Reliab1993，33，9：	1
3	Migra-tion induced material transport in Cu-Sn IMC and SnAgCu microbumps 显示文摘	Meinshausen L Weide-Zaage K Fremont H	2011	Microelectron Reliab2011，51，911：	1
4	Long-run availability of a repairable parallel system显示文摘	Vanderperre E J Makhanov S S Suchatvejapoom S	1997	Microelectron Reliab1997，37，3：	1
5	Reliability Equivalence显示文摘	Rade L	1993	Microelectron Reliab1993，33，：	1
6	A Study of Optical Noise Measurement as Reliability estimation for laser diodes 显示文摘	Xu Jiansheng Zhang Xinfa	1995	Microelectron Reliab1995，35，4：	1
7	Reliability Survival Equivalence显示文摘	Rade L	1993	Microelectron Reliab1993，33，：	1
8	Tine-series models for reliability evalution of power systems including wind energy 显示文摘	Billinton R Chen H Ghajar R	1996	Microelectron Reliab1996，36，9：	1
9	Thermal fatigue and metallurgical reactions in solder joints of LTCC modules 显示文摘	Rautioaho R Nousiainen O Saven T	2000	Microelectron Reliab2000，40，：	1
10	On gaver's parallel system sustained by a cold standby unit and attended by two repairmen显示文摘	Vanderperre E J Makhanov S S	2002	Microelectron Reliab2002，30，1：	1
11	Combing failure rate data from various sources显示文摘	Schabe H	1996	Microelectron Reliab1996，36，1：	1
12	Mechamical reliability in electronic packaging 显示文摘	Masazumi Amagai	2002	Microelectron Reliab2002，42，：	1
13	Reliability Analysis of a Series System with Repair 显示文摘	Who Kee CHUNG	1991	Microelectron Reliab1991，31，23：	1
14	Stochastic analysis of a general standby system with constant human error and arbitrary system repair rates显示文摘	Nianfu Yang Dhillon B S	1995	Microelectron Reliab1995，35，10：	1
15	Characteristics of current crowding in flip-chip solder bumps 显示文摘	Lai Y S	2006	Microelectron Reliab2006，46，56：	1
16	B and its temperature dependence are the important criteria of the reliability of semiconductor lasers显示文摘	Shi Jia-wei Jin En-shun Ma Jing	1994	Microelectron Reliab1994，34，8：	1
17	Stochastic Analysis of standby system with common-Cause and Human Errors 显示文摘	Dhillon B S Yang N	1992	Microelectron Reliab1992，32，：	1
18	A precision noise measurement and analysis method used to estimate reliability of semiconductor device显示文摘	Dai Yi-song	1997	Microelectron Reliab1997，37，6：	1
19	Electromigration : areview 显示文摘	PIERCE D G BRUSIUS P G	1997	Microelectronics Reliab1997，37，7：	1
20	Availability of a Man-Machine system with critical and normal human error 显示文摘	Dhillon B S Yang N	1993	Microelectron Reliab1993，33，10：	1

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