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16篇 您的检索式：作者名="POUGET V"

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		题名	作者	年代	出处	被引量
	1	Rate predictions for single-event effects-Critique Ⅱ显示文摘	Petersen E L Pouget V Massengill L W	2005	Nuclear Science IEEE Transcations on2005，52，61：	1
	2	La-ser cross measurement for the evaluation of single e-vent effects in integrated circuits显示文摘	POUGET V FOUILLAT P LEWIS D	2000	Microelectron-ics Reliability2000，40，2：	1
	3	Theoretical investigation of an equivalent laser LET显示文摘	POUGET V LAPUYADE H FOUILLAT P	2001	Microelectronic Reliability2001，41，：	1
	4	Investig-ation of the propagation induced pulse broadening(PIPB)effect on single event transient in SOI and Bulk Inverter Chains显示文摘	Cavrois V F Pouget V McMorrow D		0，，06：	1
	5	Dynamic behavior of a chemical sensor for real-time measurement of humidity variations in human breath显示文摘	Tetelin A Pouget V	2003	Instrumentation and Measurement Technology Conference2003，，5：	1
	6	Impact of VCO Topology on SET Induced Frequency Response显示文摘	Chen Wenjian Varanasi N Pouget V	2007	IEEE Trans on Nuclear Science2007，54，6：	1
	7	Investigation of Single-Event Transients in Voltage-controlled Oscillators显示文摘	Chen W Pouget V Barnaby H J	2003	IEEE Trans on Nuclear Science2003，50，6：	1
	8	Study of single-event transients in high-speed operational amplifiers显示文摘	Aulent P Pouget V Lewis D	2008	IEEE Transactions on Nuclear Science2008，55，4：	1
	9	Influence of laser pulse duration in single event upset testing 显示文摘	DOUIN A POUGET V DARRACQ F et oi	2006	IEEE Transactions on Nuclear Science2006，53，4：	1
	10	Theoretical investigation of an equivalent laser LET 显示文摘	POUGET V LAPUYADE H FOUILLAT P	2001	Microelectronic Reliability2001，41，：	1
	11	Validation of radiation hardened designs by pulsed laser testing and SPICE analysis显示文摘	POUGET V LEWIS D LAPUYADE H	1999	Proceedings of ESREF99 Mieroelectronics Reliability1999，39，：	1
	12	Investigation of Single-event Transients in Voltage-Controlled Oscillators 显示文摘	Chen W Pouget V Barnaby H J	2003	IEEE Trans on Nuclear Science2003，50，6：	1
	13	Impact of VCO topology on SET induced frequency response 显示文摘	CHEN W J VARANASI N POUGET V	2007	IEEE Trans Nucl Sci2007，54，6：	1
	14	Impact of VCO Topology on SET Induced Frequency Response 显示文摘	Chen W Varanasi N Pouget V	2007	IEEE Trans on Nuclear Science2007，54，6：	1
	15	Time-resolved scanning of Integrated circuits with a pulsed laser:application to transient fault injection in an ADC显示文摘	Pouget V Lewis D Fouillat P		0，，：	1
	16	Time-resolved scanning of integrated circuitswith a pulsed laser: Application to transient faultinjection in an ADC显示文摘	POUGET V LEWIS D FOUILLAT P	2004	Instrument and Meas-urement2004，53，4：	1

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