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11篇 您的检索式：作者名="Luysberg"

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		题名	作者	年代	出处	被引量
	1	Structural Properties of Microcryst-alline Silicon in the Transition from Crystalline to Amorphous Growth显示文摘	Houben L Luysberg M Hapke P	1998	Philosophical Magazine A1998，77，6：	1
	2	High mobility compressive strained Si 0.5 Ge 0.5 quantum well p-MOSFETs with higher- k /metal-gate显示文摘	W. Yu B. Zhang Q.T. Zhao J.-M. Hartmann D. Buca A. Nichau R. Lupták J.M. Lopes S. Lenk M. Luysberg K.K. Bourdelle X. Wang S. Mantl	2011	Solid State Electronics2011，，1：	1
	3	Structure and growth of hydrogenated microcrystalline silicon: investiga- tion by transmission electron microscopy and Raman spec- troscopy of films grown at different plasma excitation fre- quencies 显示文摘	Luysberg M Hapke P Carius R	1997	Philosophical Magazine A1997，75，1：	1
	4	Structural properties of microcrystalline silicon in the transition from highly crystalline to amorphous growth 显示文摘	Houben L Luysberg M Hapke P	1997	Phil MagA1997，77，6：	1
	5	Morphological and crystallographic defect properties of microcrystalline silicon: a comparison between different growth modes显示文摘	Houben L Luysberg M Hapke P	1998	J Non-Cryst Solids1998，，：	1
	6	Structural investigation and growth of -type microcrystalline silicon prepared at different plasma excitation frequencies显示文摘	Hapke P Luysberg M Carius R	1996	J Non-Cryst Solids1996，，：	1
	7	Improvement of grain size and deposition rate of microcrystalline silicon by use of very high frequency glow discharge显示文摘	Finger F Hapke P Luysberg M	1994	Appl Phys Lett1994，65，20：	1
	8	High frequency n-type MODFETs on ultra-thin virtual SiGe substrates显示文摘	Mantl S Luysberg M Fichtner P F	2003	Solid-State Electronics2003，47，7：	1
	9	Structure and growth of hydrogenated microcrystalline silicon:investiga tion by transmission electron microscopy and Raman spec troscopy of films grown at different plasma excitation fre quencies显示文摘	Hapke P Carius R	1997	Phil Mag A1997，75，1：	1
	10	High frequency n-type MOSFETs on ultra-thin virtual SiGe substrates显示文摘	MANTL S LUYSBERG M Fichtner P E	2003	Solid-State Electronics2003，23，8：	1
	11	Structure and growth of hydrogenated microcrystalline silicon: investigation by transmission dectron microscopy and Raman spectroscopy of films grown at different plasma excitation frequencies 显示文摘	Luysberg M Hapke P Carius R	1997	Phil Mag A1997，7，：	1

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