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10篇 您的检索式:作者名="LUYSBERG M"
    题名 作者 年代 出处 被引量
1Structural Properties of Microcryst-alline Silicon in the Transition from Crystalline to Amorphous Growth显示文摘Houben L Luysberg M Hapke P 1998Philosophical Magazine A1998,77,6:1
2Structure and growth of hydrogenated microcrystalline silicon: investiga- tion by transmission electron microscopy and Raman spec- troscopy of films grown at different plasma excitation fre- quencies 显示文摘Luysberg M Hapke P Carius R 1997Philosophical Magazine A1997,75,1:1
3Structural properties of microcrystalline silicon in the transition from highly crystalline to amorphous growth 显示文摘Houben L Luysberg M Hapke P 1997Phil MagA1997,77,6:1
4Morphological and crystallographic defect properties of microcrystalline silicon: a comparison between different growth modes显示文摘Houben L Luysberg M Hapke P 1998J Non-Cryst Solids1998,,:1
5Structural investigation and growth of -type microcrystalline silicon prepared at different plasma excitation frequencies显示文摘Hapke P Luysberg M Carius R 1996J Non-Cryst Solids1996,,:1
6Improvement of grain size and deposition rate of microcrystalline silicon by use of very high frequency glow discharge显示文摘Finger F Hapke P Luysberg M 1994Appl Phys Lett1994,65,20:1
7High frequency n-type MODFETs on ultra-thin virtual SiGe substrates显示文摘Mantl S Luysberg M Fichtner P F 2003Solid-State Electronics2003,47,7:1
8Structure and growth of hydrogenated microcrystalline silicon:investiga tion by transmission electron microscopy and Raman spec troscopy of films grown at different plasma excitation fre quencies显示文摘 Hapke P Carius R 1997Phil Mag A1997,75,1:1
9High frequency n-type MOSFETs on ultra-thin virtual SiGe substrates显示文摘MANTL S LUYSBERG M Fichtner P E 2003Solid-State Electronics2003,23,8:1
10Structure and growth of hydrogenated microcrystalline silicon: investigation by transmission dectron microscopy and Raman spectroscopy of films grown at different plasma excitation frequencies 显示文摘Luysberg M Hapke P Carius R 1997Phil Mag A1997,7,:1
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