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32篇 您的检索式：作者名="Estler"

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	题名	作者	年代	出处	被引量
1	Large-scale metrology- an update 显示文摘	ESTLER W T EDMUNDSON K L PEGGS G N	2002	CIRP Annals - Manu- facturing Technology2002，51，2：	1
2	Error compensation for CMM touchtriggerprobes显示文摘	Estler W T Phil ips S D Borchardt B R		0，，02：	1
3	Metabolism of doxycycline显示文摘	Becker R Estler CJ Weber A	1982	The Lancet1982，320，8303：	1
4	Global analysis of gene expression changes during retinoic acid-induced growth arrest and differentiation of melanoma: Comparison to differentially expressed genes in melanocytes vs melanoma 显示文摘	Estler M Boskovic G Denvir 1	2008	BMC Genomics2008，9，：	1
5	Large - scale metrology-An update 显示文摘	Estler W T Edmundson K L Peggs G N at al	2002	CIRP Annals-Manufacturing Tech- nology2002，51，2：	1
6	Measurement as Inference:fundamental ideas显示文摘		1999	Annals of the CIRP1999，48，2：	1
7	High-accuracy displacement interferon entry in air 显示文摘	Tyler Estler W	1985	Applied Optics(S0003-6935)1985，24，6：	1
8	Probing systems in dimensional metrology 显示文摘	WECKENMANN A ESTLER T PEGGS G	2004	Annals of the CIRP2004，53，2：	1
9	Large-scale metrology-an update 显示文摘	Estler W T Edmundson K L Peggs G N	2002	CIRP Annals-Manufacturing Technology2002，51，2：	1
10	Self-calibration:reversal,redundancy,error separation,and ‘absolute testing'显示文摘	Evans C J Hocken R J Estler W T	1996	Annals of the CIRP1996，452，：	1
11	A Distribution-Independent Bound on the Lev- el of Confidence in the Result of a Measurement显示文摘	ESTLER W T	1997	ournal of Research of the National Institute of Standards & Technology1997，102，5：	1
12	Molecular neurobiology of drug addiction显示文摘	Chao JN Estler EJ	2004	Annu Rev Med2004，55，2：	1
13	Large-scale metrology: An update显示文摘	ESTLER W T EDMUNDSON K L PEGGS G N	2002	CIRP Annals - Manufacturing Technology2002，51，2：	1
14	Probing systems in dimensional metrology显示文摘	WECKENMANN A ESTLER T PEGGS G	2004	Annals of the CIRP2004，3，2：	1
15	Practical aspects of touch - trigger probe error compensation 显示文摘	Tyler Estler W Phillips S D Borchardt B	2003	Precision Engineering2003，3，10：	1
16	Self-calibration: Reversal, redundancy,error separation, and absolute testing显示文摘	Hocken Robert J Estler W Tyler	1996	Annals of the CIRP1996，45，2：	1
17	Probing Systems in Dimensional Metrology 显示文摘	Weckenmann A Estler T Peggs G	2004	CIRP Annals-Manufacturing Technology2004，53，2：	1
18	Large- scale metrology-an update显示文摘	ESTLER W T EDMUNDSON K L PEGGS G N	2002	CIRP Annals-Manufacturing Technology2002，51，2：	1
19	Large-scale metrology:An update,CIRP annals显示文摘	Estler W T Edmundson K L Peggs G N	2002	Manufacturing Technology2002，51，2：	1
20	Probing systems in dimensional metroiogy显示文摘	WECKENMANN A ESTLER T PEGGS G	2004	CIRP Annals-Manufacturing Technology2004，53，2：	1

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