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	题名	作者	年代	出处	被引量
1	Reliability analysis of simplex and duplex memory systems with SEC and soft-error scrubbing recovery 显示文摘	Kontoleon JM Andrianakis J	2000	Int J Qual & Reliab2000，17，：	1
2	An integro-differential equation related to gaver's parallel system显示文摘	Vanderperre E J	1995	Microelectron Reliab1995，35，1：	1
3	Common-cause failure analysis of a parallel system with warm standby显示文摘	Dhilon B S Anude O C	1993	Microelectron Reliab1993，33，9：	1
4	A New Uncertainty Importance Measure显示文摘	Borgonovo E	2007	Reliab Eng Syst Saf2007，92，6：	1
5	Migra-tion induced material transport in Cu-Sn IMC and SnAgCu microbumps 显示文摘	Meinshausen L Weide-Zaage K Fremont H	2011	Microelectron Reliab2011，51，911：	1
6	Long-run availability of a repairable parallel system显示文摘	Vanderperre E J Makhanov S S Suchatvejapoom S	1997	Microelectron Reliab1997，37，3：	1
7	Toward a deeper understanding of the availability of series-systems without aging during repairs显示文摘	Winfrid G Schneeweiss	2005	IEEE Trans Reliab2005，54，1：	1
8	Reliability Equivalence显示文摘	Rade L	1993	Microelectron Reliab1993，33，：	1
9	A Gamma Wear Process 显示文摘	Abdel - Hameed M	1975	IEEE Trans Reliab1975，24，2：	1
10	Reliability performance of safety instrumented systems:A common approach for both low-and high-demand mode of operation显示文摘	Jin H Lundteigen MA Rausand M	2011	Reliab Eng Syst Safe2011，96，3：	1
11	Channel-carrier,rnobility parameters for 4H SiC MOSFETs显示文摘	LINEWlH H DIMITRIJEV S CHEONG K Y	2003	Microelec Reliab2003，43，3：	1
12	A Study of Optical Noise Measurement as Reliability estimation for laser diodes 显示文摘	Xu Jiansheng Zhang Xinfa	1995	Microelectron Reliab1995，35，4：	1
13	A study on the development of a task complexity measure for emergency operating procedures of nuclear power plants显示文摘	Park J Jung W	2006	Reliab Eng Syst Saf2006，92，：	1
14	Mechanics of thin films and microdevices 显示文摘	Ioannis Chasiotis	2004	Trans Electron Devices Mater Reliab2004，4，2：	1
15	Reliability Survival Equivalence显示文摘	Rade L	1993	Microelectron Reliab1993，33，：	1
16	Flex crackizag of multilayer ceramic capacitors assembled with Pb-free and tin-lead solders 显示文摘	KEIMASI M AZARIAN M H PECHT M G	2008	IEEE Trans Device Mater Reliab2008，，8：	1
17	Two-terminal reliability of a mobile ad hoc network under the asymptotic spatial distribution of the random way- point model显示文摘	CHEN B C	2012	Reliab Engin Sys Saf2012，106，：	1
18	Balancing Location and Dispersion Effects for Multiple Responses显示文摘	Hsiu‐Wen Chen Hongquan Xu Weng Kee Wong	2012	Qual Reliab Engng Int2012，，4：	1
19	Tine-series models for reliability evalution of power systems including wind energy 显示文摘	Billinton R Chen H Ghajar R	1996	Microelectron Reliab1996，36，9：	1
20	Thermal fatigue and metallurgical reactions in solder joints of LTCC modules 显示文摘	Rautioaho R Nousiainen O Saven T	2000	Microelectron Reliab2000，40，：	1

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