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94篇 您的检索式：作者名="Shaneyfelt"

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	题名	作者	年代	出处	被引量
1	Production and propagation of single-event transients in high-speed digital logics ICs显示文摘	Dodd P Shaneyfelt M Felix J	2004	IEEE Trans Nucl Sci2004，51，6：	1
2	Correlation betweennCo - 60 and X - ray radiation - induced charge buildup in silicon - on - insulator buried oxides 显示文摘	Schwank J R Shaneyfelt M R Dodd P E	2000	IEEE Transactions of nuclear science2000，47，6：	1
3	Current and future challenges in radiation effectson CMOS electronics 显示文摘	DODD P E SHANEYFELT M R SCHWANK J R	2010	IEEE Trans Nucl Sci2010，57，4：	1
4	Hormonal predictors of prostate cancer:a meta-analysis显示文摘	Shaneyfelt T Husein R Bubley G	2000	J Clin Oncol2000，18，4：	1
5	Overprodution of Sm28GST in a baculovirus expression vector and its use to evaluate the in vivo immune responses of mice vaccinated against Schistosoma mansoni with naked DNA encoding the Sm28GST gene显示文摘	Kayes S G Shaneyfelt R C Monteiro C	1998	J Parasitol1998，84，：	1
6	Effects of reliability screens on MOS charge trapping显示文摘	Shaneyfelt M R Winokur P S Fleetwood D M		0，，03：	1
7	Hormonal predictors of prostate cancer: a meta-a4nalysis显示文摘	Shaneyfelt T Husein R Bubley G	2000	Clin Oncol2000，8，4：	1
8	Challenges in hardening technologies using shallow-trench isolation显示文摘	Shaneyfelt M R Dodd P E Draper B L	1998	IEEE Trans Nucl Sci1998，45，6：	1
9	Effects of irradiation temperature on MOS radiation response显示文摘	Shaneyfelt M R Schw ank J R Fleetwood D M	1998	IEEE T rans N ud Sci1998，45，3：	1
10	Border Traps: Issues for MOS Radiation Response and Long - Term Reliability显示文摘	FLEETWOOD D M SHANEYFELT M R WARREN W L	1995	M icroelectronics and Reliability1995，35，3：	1
11	Effects of irradiation temperature on MOS radiation response显示文摘	Shaneyfelt M R Schwank J R Fleetwood D M	1998	IEEE Trans Nucl Sci1998，45，3：	1
12	Production and Propagation of Single-Event Transients in HighSpeed Digital Logic ICs显示文摘	Dodd Paul E Shaneyfelt Marty R Felix James A	2004	IEEE Transactions On Nuclear Science2004，51，6：	1
13	Radiation effects in SOI technologies显示文摘	Schwank J R Ferlet-Cavrois V Shaneyfelt M R	2003	IEEE Transactions on Nuclear Science2003，50，3：	1
14	Instruments for evalua ting education in evidence based practice: a systematic review 显示文摘	Shaneyfelt T Baum KD Bell D	2006	JAMA2006，296，9：	1
15	Effects of particle energy on protoninduced singleevent latchup显示文摘	SCHWANK J R SHANEYFELT M R BAGGIO J	2005	IEEE Trans Nucl Sci2005，52，6：	1
16	Transient and total dose irrandiation of BESOI 4K SRAM显示文摘	Hash G L Schwank J R Shaneyfelt M R	1994	IEEE Trans Nucl Sci1994，1114，：	1
17	Charge yield for Cobalt-60 and 10 keV X-ray irra- diations of MOS devices 显示文摘	Shaneyfelt M R Fleetwood D M Schwank J R	1991	IEEE Trans Nucl Sci1991，38，6：	1
18	查看详情显示文摘	Schwank J R Ferlet-Cavrois V Shaneyfelt M R Fleetwood D M Paillet P Dodd P E		0，，：	1
19	Theory and application of dual-transistor charge separation analysis 显示文摘	FLEETWOOD D M SHANEYFELT M R SCHWANK J R	1989	IEEE Trans Nucl Sci1989，36，6：	1
20	Radiation effects in MOS oxides显示文摘	SCHWANK J R SHANEYFELT M R FLEETWOOD D M	2008	IEEE Trans Nucl Sci2008，55，4：	1

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