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	题名	作者	年代	出处	被引量
1	CEP: cor- related error propagation for hierarchical soft error analy- sis显示文摘	CHEN L EBRAHIMI M TAHOORI M B	2013	Journal of Electronic Testing2013，1，1：	1
2	Scalability of globally asynchronous QCA (quantum-dot cellular automata) adder design 显示文摘	MINSU C MYUNGSU C	2008	Journal of Electronic Testing2008，24，123：	1
3	An automotive CD-player electro-mechanics fault simulation using VHDL-AMS显示文摘	GRAZIANO M ROCH M R R	2008	Journal of Electronic Testing2008，，6：	1
4	Single-Event Effects Analysis of a Pulse Width Modulator IC in a DC/DC Converter显示文摘	Y. Ren L. Fan L. Chen S.-J. Wen R. Wong N. W. Vonno A. F. Witulski B. L. Bhuva	2012	Journal of Electronic Testing2012，，6：	1
5	A Reliable Architecture for Parallel Implementations of the Advanced Encryption Standard显示文摘	Natale G D Doulcier M Flottes M L	2009	Journal of Electronic Testing2009，25，45：	1
6	Reliability statistics perspective on standard wafer-level electromigration accelerated test (SWEAT)显示文摘	Tan C M Yeo K N C	2001	J Electronic Testing2001，17，1：	1
7	A new algorithm for the selection of control cells in boundary-scan interconnect test显示文摘	Quiros-Olozabal A Cifredo-CHacon M A	2009	Journal of Electronic Testing2009，25，2：	1
8	Test Wrapper and Test Access Mechanism Co-Optimization for System-on-Chip显示文摘	Vikram Iyengar Krishnendu Chakrabarty Erik Jan Marinissen	2002	Journal of Electronic Testing2002，，2：	1
9	Evaluating the effectiveness of a software based technique under SEEs using FPGA based fault injection approach 显示文摘	PORTELA G M LINDOSO A ENTRENA L	2012	Journal of Electronic Testing2012，28，6：	1
10	A Formal Analysis of Fault Diagnosis with D- Matrices 显示文摘	Sheppard J W Butcher S	2007	Journal of Electronic Testing Theory and Applications2007，，23：	1
11	QCA circuits for robust coplanar crossing显示文摘	BHANJA S OTTAVI M LOMBARDI F	2007	Journal of Electronic Testing2007，23，2：	1
12	Multiple fault detection in two-level multi-output circuits显示文摘	James Jacob Vishwani D. Agrawal	1992	Journal of Electronic Testing1992，，2：	1
13	A new analog circuit fault diagnosis method based on improved mahalanobis distance显示文摘	Han Han Wang Houjun Tian Shulin	2013	Journal of Electron Test2013，29，：	1
14	A Novel test point selection method for analog fault dictionary tech- niques 显示文摘	YANG CH L TIAN SH L LONG B	2010	Journal of Electronic Testing2010，26，5：	1
15	Software and hardware techniques for SEU detection in IP pro- cessors 显示文摘	Bolchini C Miele A Rebaudengo M etc	2008	Journal of Electronic Testing2008，24，1：	1
16	Development of a LabVIEW-based test facility for standalone PV systems 显示文摘	Alex S K Shen Weixiang Ong K S	2006	Third IEEE International Workshop on Electronic Design Test and Applications2006，4，：	1
17	Diagnostics of filtered analog circuits with tolerance based on LS_ SVM using frequency features显示文摘	Long B Tian S Wang H J	2012	J Electron Test2012，28，3：	1
18	SEU Fault-Injection in VHDL- Based Processors: A Case Study显示文摘	Wassim Mansour Raoul Velazco	2013	J Electron Test2013，29，：	1
19	A probabilistic approach to diagnose SETs in sequential circuits显示文摘	Gangadhar S Tragnudas S	2013	Journal of Electronic Testing2013，29，3：	1
20	Modeling and evaluating errors due to random clock shifts in quantum-dot cellular automata circuits显示文摘	KARIM F OTTAVI M HASHEMPOUR H	2009	Journal of Electronic Testing2009，25，1：	1

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