5篇
您的检索式：作者名="YanJunGONG"
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| 1 | Determination of interface layer thickness of a pseudo two—phase system by extension of the Debye equation显示文摘The Debye equation with slit-smeared small angle x-ray scattering(SAXS) data is extended form an ideal two-phase system to a pseudo two-phase system with the presence of the interface layer,and a simple accurate solution is proposed to determine the average thickness of the interface layer in porous materials.This method is tested by experimental SAXS data,which were measured at 25℃,of organo-modified mesoporous silica prepared by condensation of tetraethoxysiland(TEOS) and methyltriethoxysilane(MTES) using non-ionic neutral surfactant as template under neutral condition. | ZhiHongLi YanJunGong MinPu DongWu YuHanSun JunWang YiLiu BaoZh | 2001 | Beijing Synchrotron Radiation Facility2001，，2： | 3 |
| 2 | Determination of Average wall Thickness of Mesoporous silica显示文摘Small X-ray Scattering (SAXS) experiment using Synchrotron Radiation as X-ray source was used to determine the average wall thickness of mesoporous silica prepard by condensation of tetraethylorthosilicate(TEOS) using non-ionic alkylpolyethyleneoxide(AEO9) surfactant as templates.The results agreed with that of high-resolution TEM(HRTEM) measurement. | ZhiHongLi YanJunGONG DongWu YuHanSUN JunWANG YiLIU BaoZhongDON | 2001 | Beijing Synchrotron Radiation Facility2001，，2： | 0 |
| 3 | SAXS andalysis of interface in organo—modified mesoporous silica显示文摘A small-angle x-ray scattering(SAXS)technique using synchrotron radiation as the x-ray source has been employed to characterize the microstructure of mesoporous silica prepared by one-pot template-directed synthesis methodology.The scattering of pure silica agreed with Porod’s law.the scattering of organomodified mesoporous silica showed a negative deviation from Porod’s law,suggesting that an interfacial layer exists between the pores and silica matrix.It was the organic groups comprising the interface,as shown by ^29Si cross-polarization magic-angle spinning nuclear magnetic resonance imaging (^29Si cp MAS/NMR) and Fourier transform infrared spectroscopy(FTIR),that caused this negative deviation of SAXS intensity from Porod’s law,and the average thichness of the interfacial layer could be deduced from this negative deviation.Copyright 2001 john Wiley and Sons,Ltd. | ZhiHongLi YanJunGong DongWu YuHanSun JunWang YiLiu BaozhongDon | 2001 | Beijing Synchrotron Radiation Facility2001，，2： | 0 |
| 4 | Correction of negative deviation from Dedye’s theory显示文摘 | ZHIHONGLI YANJUNGONG DONGWU YUHANSUN ZHIHONGLI YANJUNGONG DONG | 2001 | Beijing Synchrotron Radiation Facility2001，，2： | 0 |
| 5 | Evaluation of Average Wall Thickness of Organically Modified Mesoporous Silica显示文摘The small angle X-ray scattering of organically modified MSU-X silica prepared by co-condensation of tetraethoxysilane (TEOS) and methyltriethoxysilane (MTES) show negative deviation from Debye’s theory due to the existence of the organic interface layer. By exerting correction of the scattering negative deviation, Debye relation may be recovered, and the average wall thickness of the material may be evaluated. | YanJunGONG ZhiHongLI BaoZhongDONG | 2005 | Chinese Chemical Letters2005，16，1： | 0 |
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