| 1 | Determination of interface layer thickness of a pseudo two—phase system by extension of the Debye equation显示文摘The Debye equation with slit-smeared small angle x-ray scattering(SAXS) data is extended form an ideal two-phase system to a pseudo two-phase system with the presence of the interface layer,and a simple accurate solution is proposed to determine the average thickness of the interface layer in porous materials.This method is tested by experimental SAXS data,which were measured at 25℃,of organo-modified mesoporous silica prepared by condensation of tetraethoxysiland(TEOS) and methyltriethoxysilane(MTES) using non-ionic neutral surfactant as template under neutral condition. | ZhiHongLi YanJunGong MinPu DongWu YuHanSun JunWang YiLiu BaoZh | 2001 | Beijing Synchrotron Radiation Facility2001，，2： | 3 |
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