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11篇 您的检索式：作者名="Vasi V"

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		题名	作者	年代	出处	被引量
	1	Superior hot carrier reliability of single halo (SH) silicon - on - insulator(SOI) nMOSFET in analog applications 显示文摘	Hakim N Rao V R Vasi J	2005	IEEE Transactions on Device and Materials Reliability2005，5，1：	1
	2	Morphological development of the human placenta in normal and complicated gestation: a quantitative and ultrastructural study显示文摘	Biagini G Vasi V Pugnaloni A	1989	Gynecol Obstet Invest1989，28，2：	1
	3	Rapid production of transgenie wheat plant by direct bombardment of cultured immature embryos 显示文摘	Vasi V Srivatava V Castillo A M	1993	Bioteehnology1993，，11：	1
	4	Two-dimensional numerical simulation of oxide charge buildup in MOS transistors due to radiation显示文摘	VASUDEVAN V VASI J	1994	IEEE Trans Elec Dev1994，41，3：	1
	5	A numerical simulation of hole and electron trapping due to radiation in silicon dioxide显示文摘	VASUDEVAN V VASI J	1991	J Appl Phys1991，70，5：	1
	6	Inspection tool for harsh environment operation utilizing pulsed remote field technique 显示文摘	Ambru D Bilas V Vasi d D	2005	Instrumentation and Measurement Technology Conference2005，，：	1
	7	A two-dimensional numerical simulation of oxide charge buildup in MOS transistors due to radiation显示文摘	Vasudevan V Vasi J	1994	IEEE Trans on Electron Devices1994，41，3：	1
	8	Analysis of C1, C2, and C10 through C33 particle-phase and semi- volatile organic compound emissions from heavy-duty diesel engines显示文摘	Gerald L Z Berg D R Vasys V N	2010	Atmospheric Environment2010，44，8：	1
	9	Mixed Cere-brovascular Disease and the Future of Stroke Prevention显示文摘	Fisher M Vasi\|evko V Cribbs D l-I	2012	Translational Stroke Research2012，3，1：	1
	10	Measurement of ferromagnetic tube wall thickness using pulsed remote field technique显示文摘	Vasi D Bilas V Ambru D	2002	12th IMEKO TC4 International Symposium2002，，：	1
	11	Inspection tool for harsh environment operation utilizing pulsed remote field technique 显示文摘	Ambru D Bilas V Vasi D	2005	Instrumentation and Measurement Technology Conference2005，，：	1

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