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| 1 | SOME NEW RESULTS ON THE CONFIDENCELIMITS FOR RELIABILITY PARAMETERS IN THECASE OF NO FAILURES显示文摘In reliability tests, Type I censored data are common. For products of high quality, real life length is much longer than the censoring time. A group of items of some kind of product are put into reliability experiment. In case every item is censored,there is no failure. We refer to such data as No Failures. We construct lower confidence limits for life characteristics (such as average life, reliability, reliable span). This is done under the assumption of Weibull distribution, Lognormal distribution and nonparametric distribution family in the case of no failures. | SUN Wanlong CHEN Jiading (Department of Probability and Statistics, Peking University, Beijing 100871, China) | 1999 | Systems Science and Mathematical Sciences1999，12，1： | 5 |
| 2 | On comparison of jump point detection for an exchange rate series显示文摘The main purpose of this paper is to investigate the detection of jump points of a discontinuous function in the presence of a noise by the wavelet approach. A computing algorithm of our method is proposed and then applied to the daily exchange rate of US Dollar against Deutsche Mark. All the points detected by our method reflect very strong economic and political impacts. Other statistical methods to detect jump points have also been applied to the same exchange rate data. Our proposed method has produced more convincing empirical results than others. | IP Wai-Cheung, WONG Heung, XIE Zhongjie & LUAN YihuiDepartment of Applied Mathematics, Hong Kong Polytechnic University, Hong Kong, China Department of Probability and Statistics, Peking University, Beijing 100871, China | 2004 | Science China Mathematics2004，47，1： | 2 |
| 3 | IEEE reliability test system显示文摘 | The Reliability Test System Task Force of the Application of Probability Methods Subcommittee | 1979 | IEEE Transactions on Power Apparatus and Systems1979，98，： | 1 |
| 4 | IEEE reliability test system 显示文摘 | The Reliability Test System Task Force of the Application of Probability Methods Subcommittee | 1979 | IEEE Transactions on Power Apparatus and Systems1979，98，6： | 1 |
| 5 | IEEE reliability test system显示文摘 | The Reliability Test System Task Force of the Application of Probability Methods Subcommittee | 1979 | IEEE Trans on Power Apparatus and Systems1979，98，6： | 1 |
| 6 | The IEEE reliability test system--1996显示文摘 | The Reliability Test System Task Force of the Application of Probability Methods Subcommittee | 1999 | IEEE Trans on Power Systems1999，14，3： | 1 |
| 7 | IEEE reliability test system显示文摘 | The Reliability Test System Task Force of the Application of Probability Methods Subcommittee | | 0，，06： | 1 |
| 8 | IEEE reliability test system显示文摘 | A report prepared by the Reliability Test System Task Force of the Application of Probability Methods Subcommittee | 1979 | IEEE Transactions on Power Apparatus and Systems1979，98，6： | 1 |
| 9 | The IEEE reliability test system-1996显示文摘 | The reliability test system task force of the application of probability methods sub committee | 1999 | IEEE Trans on Power Systems1999，14，3： | 1 |
| 10 | Academic Press显示文摘 | Fourier analysis in probability theory | 1972 | New York1972，，： | 1 |
| 11 | The IEEE reliability test system-1996显示文摘 | The Reliability Test System Task Force of the Application of Probability Methods Subcommittee | 1996 | IEEE Trans on Power Systems1996，14，3： | 1 |
| 12 | IEEE Reliability Test System 显示文摘 | A Report Prepared by the Reliability Test System Task Force of the Application of Probability Methods Subcommittee | 1979 | IEEE Transactions on Power Apparatus and Systems1979，98，6： | 1 |
| 13 | The IEEE reliability test system-1996: a report prepared by the Reliability Test System Task Force of the Application of Probability Methods Subcommittee显示文摘 | Reliability Test System Task Force of the Application of Probability Methods Subcommittee | 1999 | IEEE Trans on Power Systems1999，14，3： | 1 |
| 14 | IEEE Reliability Test System显示文摘 | Reliability Test System Task Force of the Application of Probability Methods Subcommittee | 1979 | IEEE Transactions on Power Apparatus and Systems1979，98，6： | 1 |
| 15 | Analysis of the failure equipment with service life extension of nuclear power plants显示文摘 | Tkachev V V Zheltukhin K probability of pipelines and K | 2008 | Atomic Energy2008，104，5： | 1 |
| 16 | IEEE reliability test system显示文摘 | The Reliability Test System Task Force of the Application of Probability Methods Subcommittee | 1979 | IEEE Trans on Power Apparatus and Systems1979，98，6： | 1 |
| 17 | THE ASYMPTOTICS OF THE INTEGRATEDSQUARE ERROR FOR THE KERNEL HAZARD RATEESTIMATORS WITH LEFT TRENCATED ANDRIGHT CENSORED DATA显示文摘A central limit theorem for the integrated square error (ISE) of the kernelhazard rate estimators is obtained based on left truncated and right censored data. Anasymptotic representation of the mean integrated square error (MISE) for the kernel hazardrate estimators is also presented. | SUN Liuquan(Institute of Applied Mathematics, Academia Sinica, Beijing 100080, China)ZHENG Zhongguo(Department of Probability and Statistics, Peking University, Beijing 100871, China) | 1999 | Systems Science and Mathematical Sciences1999，12，3： | 1 |
| 18 | IEEE reliability test system显示文摘 | | 1979 | IEEE Transactions on Power Apparatus and Systems1979，98，6： | 1 |
| 19 | On some tests-based projection pursuit for elliptical symmetry of a high-dimensional distribution显示文摘Some test statistics of Kolmogorov type and Cramér-von Mises type based on projection pursuit technique are proposed for the testing problem of sphericity of a high-dimensional distribution. The limiting distributions of the test statistics are derived under the null hypothesis and under any fixed alternative. The asymptotic properties of bootstrap approximation are investigated. Furthermore, for computational reasons, an approximation for the statistics, based on the number theoretic method, is suggested. | JING Ping 1 and ZHU Lixing 2 1. Mathematics Lab, China University of Mining & Technology, Beijing 100083, China 2. Probability Lab, Institute of Applied Mathematics, Chinese Academy of Sciences, Beijing 100080, China | 1998 | Chinese Science Bulletin1998，43，6： | 1 |
| 20 | The IEEE reliability test system-1996 显示文摘 | Reliability Test System Task Force of the Application of Probability Methods Subcommittee | 1999 | IEEETrans on Power Systems1999，14，3： | 1 |
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