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24篇 您的检索式:作者名="Perkinson T L"
    题名 作者 年代 出处 被引量
1Single-wafer Cluster Tool Performance: An analysis of the Effects of Redundant Chambers and Revisitations Sequences on Throughput 显示文摘T L Perkinson R S Gyumsik P K MacLarty 1996IEEE Transactions on Semiconductor Manufacturing (S0894-6507)1996,9,3:1
2Singlewafer Cluster Tool Performance: An Analysis of Throughput 显示文摘T L Perkinson P K MacLarty R S Gyurcsik R K Cavin Ⅲ 1994IEEE Transactions on Semiconductor Manufacturing (S0894-6507)1994,7,3:1
3Single-wafer cluster tool performance: an analysis of the effects of redundant chambers and revisitations sequences on throughput 显示文摘Perkinson T L Gyurcsik R S MacLarty P K 1996IEEE Transactions on Semiconductor Manufacturing1996,9,3:1
4Single-wafer cluster tool performance: An analysis of the effects of redundant chambers and revisitations sequences on throughput显示文摘Perkinson T L Gyurcsik R S MacLarty P K 1996IEEE Transactions on Semiconductor Manufacturing1996,9,:1
5Single-wafer cluster tool performance: An analysis of throughput显示文摘Perkinson T L MacLarty P K Gyurcsik R S Cavin R K 1994IEEE Transactions on Semiconductor Manufacturing1994,7,:1
6Single-wafer cluster tool performance: an analysis of the effects of redundant chamhers and revisitation sequences on throughput显示文摘PERKINSON T L GYURCSIK R S MCLARTY P K 1996IEEE Transactions on Semiconductor Manufacturing1996,9,3:1
7Single wafer cluster tool performance: An analysis of the effects of redundant chambers and revisitation sequences on throughput 显示文摘PERKINSON T L GYURCSIK R S MCLARTY P Z 1996IEEE Transaction on Semi- conductor Manufacturing1996,9,3:1
8Single-wafer cluster tool performance: an analysis of the effects of redundant chambers and revisitation sequences on throughput 显示文摘Perkinson T L Gyurcsik R S Mclarty P K 1996IEEE Transactions on Semiconductor Manufacturing (S0894-6507)1996,9,3:1
9Single-wafer cluster tool performance: an analysis of the effects of redundant chambers and revisitation sequences on throughput显示文摘PERKINSON T L GYURCSIK R S MCLARTY P K 1996IEEE Transactions on Semiconductor Manufacturing1996,9,3:1
10Single-wafer cluster tools performance; an analysis of throughput显示文摘PERKINSON T L MACLARTY P K GYURCSIK R S 1994IEEE Transactions on Semiconductor Manu- facturing1994,7,2:1
11Single-wafer cluster tool performance: an analysis of the effects of redundant chambers and revisitation sequences on throughput 显示文摘Perkinson T L Gyurcsik R S McLarty P K 1996'iEEE Transactions on Semiconductor Manufacturing1996,9,3:1
12Single-wafer cluster tool performance: an analysis of the effects of redundant chambers and revisitation sequences on throughput 显示文摘PERKINSON T L GYURCSIK R S MCLARTY P K 1996IEEE Trans- actions on Semiconductor Manufacturing1996,9,3:1
13Singlewafer cluster tool performance: an analysis of throughput 显示文摘Perkinson T L MacLarty P K Gyurcsik R S 1994IEEE Transactions on Semiconductor Manufacturing1994,7,3:1
14Single-wa- fer cluster tool performance: an analysis of the effects of redundant chambers and revisitation sequences on through- put显示文摘Perkinson T L Gyurcsik R S McLarty P K 1996IEEE Transactions on Semiconductor Manufactur- ing1996,9,3:1
15Single- wafer cluster tool performance: An analysis of the effects of redundant chambers and revisitation se- quences on throughput 显示文摘Perkinson T L Gyurcsik R S McLarty P K 1996IEEE Transactions on Semiconductor Manufacturing1996,9,38:1
16Single-wafer cluster tool performance: An analy sis of the effects of redundant chambers and revlsitat显示文摘PERKINSON T L GYURCSIK R S MCLARTY P K 1996IEEE Transactions on Semiconductor Manufacturing1996,9,38:1
17Single- wafer cluster tool performance: an analysis of throughput显示文摘PERKINSON T L MACLARTY P K GYURCSIK R S 1994IEEE Transactions on Semiconductor Manufacturing1994,7,3:1
18Singlewafer cluster tool performance: An analysis of the effects of redundant chambers and revisitation sequences on throughput 显示文摘Perkinson T L Gyurcsik R S MeLarty P K 1996IEEE Trans Semicond Manufact1996,9,3:1
19Single-wafer cluster tool performance: an analysis of throughput 显示文摘Perkinson T L McLarty P K Gyuresik R S 1994IEEE Trans Semieond Manufact1994,7,3:1
20Single-wafer cluster tool performance: an analysis of throughput 显示文摘PERKINSON T L MCLARTY P K GYURCSIK R S 1994IEEE Transactions on Semiconductor Manufacturing1994,7,3:1
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