维普中文期刊产品整合服务
7篇 您的检索式:作者名="OUKAOUR A"
    题名 作者 年代 出处 被引量
1Ageing defect detection on IGBT power modules by artificial training methods based on pattern recognition显示文摘A Oukaour B Tala-Ighil B Pouderoux M Tounsi M Bouarroudj-Berkani S Lefebvre B Boudart 0,,02:1
2Ageing defect detection on IGBT power modules by artificial training methods based on pattern recognition显示文摘OUKAOUR A TALA-IGHIL B POUDEROUS B 2011Microelectronics Reliability2011,51,1:1
3Characterization of high-voltage IGBT module degradations under PWM power cycling test at high ambient temperature显示文摘TOUNSI M OUKAOUR A TALA-IGHIL B 2010Microelectronics Reliability2010,50,8:1
4Characterization of high-voltage IGBT module degradations under PWM power cycling test at high ambient temperature 显示文摘TOUNSI M OUKAOUR A TALA I B 2010Microelectronics Reliability2010,50,911:1
5Ageing defect detection on IGBT power modules by artifi- cial training methods based on pattern recognition 显示文摘OUKAOUR A TALA-IGHIL B POUDEROUX B 2011Microelectronics Reliability2011,51,2:1
6Ageing defect detection on IGBT power modules by artificial training methods based on pattern recognition 显示文摘oUKAOUR A TALA L B POUDEROUX B 2011Microelectronics Reliability2011,51,2:1
7State-of-charge and state-of-health lithium-ion batteries' diagnosis according to surface temperature variation显示文摘EL MEJDOUBIA OUKAOUR A CHAOUI H 2016IEEE Transactions on Industrial Electronics2016,63,4:1
返回顶部 每页显示:
共1页 首页 上一页 第1页 下一页 末页 /1 跳转

网站首页 | 关于我们 | 联系我们 | 产品服务 | 客服中心 | 广告服务 | 版权声明 | 网站联盟 | 友情链接 | 售卡网点

版权所有© 渝B2-20050021-1 渝公网安备 50019002500403号 违法和不良信息举报中心

互联网出版许可证 新出网证(渝)字10号 全国400电话 - 免长途话费