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12篇 您的检索式：作者名="Martinuzzi O"

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		题名	作者	年代	出处	被引量
	1	Chromosomal control of wheat gliadin protein epitopes: Analysis with specific monoclonal antibodies 显示文摘	Martinuzzi O Metakovsky E V	1991	Theor Appl Genet1991，82，：	1
	2	How to double the spatial resolution of a push-broom instrument显示文摘	Hagolle O Martinuzzi J M Latry C	1994	Proc of IEEE Geoscience and Remote Sensing Symposium Pasadena CA USA (IGARSS ''94) ?19941994，3，：	1
	3	Minority carrier li- fetime and metallic-impurity mapping in silicon wafers 显示文摘	Palais O Martinuzzi S Simon J J	2001	Materials Science in Semiconductor Processing2001，4，13：	1
	4	Minority carrier lifetime scan maps applied to iron concentration mapping in silicon wafers显示文摘	Palais O Yakimov E Martinuzzi S	2002	Materials Science and Engineering2002，9192，：	1
	5	Minority carrier lifetime scan maps applied to iron concentration mapping in silicon wafers Materials 显示文摘	Palais O Yakimov E Martinuzzi S	2002	Materials Science and Engineering: B2002，9192，：	1
	6	Behaviour of metallic impurities at grain boundaries and dislocation clusters in multicrystalline silicon wafers deduced from contactless lifetime scan maps显示文摘	Hidalgo P Palais O Martinuzzi S	2004	J Phys Condens Matter2004，16，：	1
	7	Segregation phenomena in large-size cast multicrystalline Si ingots显示文摘	Martinuzzi S Perichaud I Palais O	2007	Solar Energy Mater Solar Cells2007，，91：	1
	8	Segregation phenomena in large-size cast multicrystalline Si ingots显示文摘	MARTINUZZI S PE′RICHAUD I PALAIS O	2007	Solar Energy Materials and Solar Cells2007，91，13：	1
	9	Land development, land use, and urban sprawl in Puerto Rico integrating remote sensing and population census data显示文摘	Martinuzzi S Gould W A Ramos G O M	2007	Landscape and Urban Planning2007，79，3：	1
	10	Segregation phenomena in large size cast multicrystalline Si ingots显示文摘	Martinuzzi S Perichaud I Palaisv O		0，，：	1
	11	Segregation phenomena in large-size cast multicrystalline Si ingots显示文摘	Martinuzzi S Perichaud I Palaisv O	2007	Solar Energy Mater Solar Cells2007，91，：	1
	12	Behaviour of metallic impurities at grain boundaries and dislocation clusters in multicrystalline silicon wafers deduced from contactless lifetime scan maps显示文摘	Hidalgo P Palais O Martinuzzi S	2004	Condens Matter2004，16，2：	1

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