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7篇 您的检索式:作者名="Jacques lefebvre"
    题名 作者 年代 出处 被引量
1Polarized Light Microscopy and Spectroscopy of Individual Single-Walled Carbon Nanotubes显示文摘极化的轻显微镜学(PLM ) 习惯于围单人赛的碳 nanotubes (SWNT ) 越过裂缝开始在空中推迟了的图象个人。成像对比依靠典型地代表 SWNT 的强壮的光 anisotropy。我们把 PLM 与悦耳的轻来源相结合启用 hyperspectral 刺激光谱学和 nanotube chirality 赋值。有荧光显微镜学和光谱学的比较证实与 PLM 做的任务。这代表一条万用的新途径到成像 SWNT 和相关结构。Jacques Lefebvre Paul Finnie 2011Nano Research2011,4,8:2
2The Dynamics of the Nucleation, Growth and Termination of Single-Walled Carbon Nanotubes from in situ Raman Spectroscopy During Chemical Vapor Deposition显示文摘The dynamics of the chemical vapor deposition(CVD)of single-walled carbon nanotubes(SWNTs)is extracted experimentally using in situ Raman spectroscopy.Nanotubes are grown using a thinlm cobalt catalyst and an ethanol precursor in a miniature hot walled reactor with optical access.Raman spectra at room temperature and at the growth temperature are compared for two growth temperatures.The evolution of the G-band,D-band,and radial breathing mode(RBM)is tracked at the growth temperature with time resolution of a few seconds.There are three identifiable phases in the evolution of the Raman signal intensity:an initial exponential increasing phase,a linear growth phase,and a saturation phase.In situ optical spectroscopy thus enables the study of nucleation,steady growth,and deactivation processes to be investigated separately in real time.The evolution curves for all bands(G,D,and RBM),when scaled,collapse onto the same curve,to within experimental uncertainty.Paul Finnie Andrew Li-Pook-Than Jacques Lefebvre 2009Nano Research2009,2,10:2
3Deformation-Corrosion Interactions for Zr Alloys during I-SCC CYack Initiation Part I:Chemical Contributions显示文摘Patrick Jacques Florence Lefebvre Clement Lemaignan 1999Journal of Nuclear Materials1999,264,23:1
4Raman microscopy mapping for the purity assessment of chirality enriched carbon nanotube networks in thin- film transistors显示文摘With recent improvements in carbon nanotube separation methods, the accurate determination of residual metallic carbon nanotubes in a purified nanotube sample is important, particularly for those interested in using semiconducting single-walled carbon nanotubes (SWCNTs) in electronic device applications such as thin-film transistors (TFTs). This work demonstrates that Raman microscopy mapping is a powerful characterization tool for quantifying residual metallic carbon nanotubes present in highly enriched semiconducting nanotube networks. Raman mapping correlates well with absorption spectroscopy, yet it provides greater differentiation in purity. Electrical data from TFTs with channel lengths of 2.5 and 5μ m demonstrate the utility of the method. By comparing samples with nominal purities of 99.0% and 99.8%, a clear differentiation can be made when evaluating the current on/off ratio as a function of channel length, and thus the Raman mapping method provides a means to guide device fabrication by correlating SWCNT network density and purity with TFT channel scaling.Zhao Li Jianfu Ding Paul Finnie Jacques Lefebvre Fuyong Cheng ChristopherT. Kingston Patrick R. L. Malenfant 2015Nano Research2015,8,7:1
5Topology error detection and identification in network analysis显示文摘Serge Lefebvre Jacques Prévost 2006International Journal of Electrical Power and Energy Systems2006,,5:1
6Prolamin aggregation gluten viscoelasticity and mixing properties of transgenes显示文摘Yves popineau Gibert Deshayes Jacques lefebvre etal 2001J agric Food chem2001,49,:1
7The compressibility and sensitivity of an artificially sedimented clay soil: The Grande-Baleine Marine Clay, Quebec, Canada显示文摘Jacques Locat Guy Lefebvre 1985Marine Georesources & Geotechnology1985,,1:1
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