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96篇 您的检索式:期刊名="IEEE Transaction on CAD"
    题名 作者 年代 出处 被引量
1Synthesis of one-dimensional linear hybrid cellular autornata显示文摘Cattell K 1996IEEE Transactions on CAD1996,15,3:1
2System-on-a-Chip test data compression and decompression architectures based on Golomb codes 显示文摘Chandra A Chakrabarty K 2001IEEE Transactions on CAD of Integrated Circuits and System2001,20,3:1
3Automated design debugging with abstraction and refinement 显示文摘Safarpour S Veneris A 2009IEEE Transaction on CAD2009,28,10:1
4A digital design flow for secure integratedcircuits显示文摘Tiri K Verbauwhede 1 2006IEEE Transactions on CAD of Integrated Circuits andSystems2006,25,7:1
5System-on-a-chip test data compression and decompression architectures based on Golomb codes显示文摘Chandra A Chakrabarty K 2001IEEE Transactions on CAD of Integrated Circuits and System2001,20,3:1
6System-on-a-Chip test data compression and decompression architectures based on Golomb codes显示文摘Chandra A Chakrabarty K 2001IEEE Transactions on CAD of Integrated Circuits and Systems2001,20,3:1
7A realistic fault model and test algorithms for static random access memories显示文摘Dekker R Beenker F Thijssen L 1990IEEE transaction on CAD1990,9,6:1
8Variable-length input huffman coding for system-on-a-chip tast显示文摘Gonciari P T AI-Hashimi B M Nicolici N 2003IEEE Transactions on CAD of Integrated Circuits and Systems2003,22,6:1
9Fixing design errors with counterexamples and resynthesis 显示文摘Chang K H Markov I L Bertacco V 2008IEEE Transaction on CAD2008,27,1:1
10A realistic fault model and test algorithms for static random access memories 显示文摘Dekker R Beenker F Thijssen L 1990IEEE transaction on CAD1990,9,6:1
11Bounded model debugging显示文摘Keng B Safarpour S Veneris A 2010IEEE Transaction on CAD2010,29,11:1
12Hierarchical finite state machineswith multiple concurrency models 显示文摘GIRAULT A LEE B LEE E 1999IEEE Transactions on CAD1999,18,6:1
13Comer stitching: a data-structuring technique for VLSI layout tools 显示文摘John K Ousterhout 1984IEEE Transaction on CAD1984,,1:1
14Variable-Length Input Huffman Coding for System-on-a-Chip Test 显示文摘Paul T Gonciari Bashir M Al-Hashimi Nicolici N 2003IEEE Transactions on CAD of Integrated Circuits and Systems IEEE Transitions on CAD of Integrated Circuits and System (S0278-0070)2003,22,6:1
15Transition density: a new measure of activity in digital circuits显示文摘Najm F 1993IEEE Transactions on CAD1993,12,2:1
16SubIslands:The probabilistic match assignment algorithm for subcircuit recognition显示文摘RUBANOV N 2003IEEE Transactions on CAD of Integrated Circuits and Systems2003,22,1:1
17Application of symbolic computer algebra in high-level data-flow synthesis显示文摘Peymandoust A Micheli D G 2003IEEE Transactions on CAD of IC and Systems2003,22,9:1
183-Weight Pseudo-random test generation Based on a deterministic test set for combinational and sequential circuits显示文摘Pomeranz I Reddy S M 1993IEEE Transactions on CAD1993,12,9:1
19New Spectral Methods for Ratio Cut Partitioning and Clustering显示文摘Hagen L W Kahng A B 1992IEEE Transactions on CAD of Integrated Circuits and Systems1992,11,9:1
20Algorithms for minimizing standby power in deep submicrometer, dual-Vt CMOS circuits显示文摘Qi Wang Sarma B K Vrudhula 2002IEEE Transactions on CAD of IC and System2002,21,3:1
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