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12篇 您的检索式:期刊名="IEEE Trans Elect Dev"
    题名 作者 年代 出处 被引量
1Assessing the Reliability of Silicon Nitride Capacitors in a GaAs IC Process显示文摘Yeats B 1998IEEE Trans on Elect Dev1998,45,5:1
2Modeling and Characterization of Gate Oxide Reliability显示文摘Lee Jack C Chen In- Chin Hu Chenming 1998IEEE Trans on Elect Dev1998,5,10:1
3Assessing the reliability of silicon nitride capacitors in a GaAs IC process显示文摘Yeats B 1998IEEE Trans on Elect Dev1998,45,8:1
4显示文摘Bunton G V Quilliam R M 1973IEEE Trans Elect Dev1973,20,:1
5Drawbacks to using NIST electromigration test-structure to test bamboo metal Lines显示文摘 SCORZONI A TAMARR F 1994IEEE Trans Elect Dev1994,41,12:1
6Recent is- sues in negative-bias temperature instability: initial degrada- tion, field dependence of interface trap generation, hole trap- ping effects, and relaxation 显示文摘Ahmad Ehteshamul Islam Haldun Kufluoglu Dhanoop Varghese Souvik Mahapatia Muhammad Ashraful Alam 2007IEEE Trans Election Dev2007,54,9:1
7Semiconductor power devices显示文摘Grandi S K Temple V A K 1983IEEE Trans Elect Dev1983,30,8:1
8Multistep field plates for high-voltage planar p-n junctions 显示文摘Wolfgang Feiler Elmar Falck Willi Gerlach 1992IEEE Trans Elect Dev1992,39,6:1
9Charge injection transistor based on real-space hot-electron transfer显示文摘Luryi S Kastalsky A Gossard A C 1984IEEE Trans Elect Dev1984,31,:1
10Impurities in Silicon Solar Cells显示文摘Davis J R Rohatgi A Hopkins R H 1980IEEE Trans Elect Dev1980,27,:1
11Multi- step field plates for high-voltage planar p-n junctions 显示文摘Wolfgang Feiler Elmar Falck Willi Gerlach 1992IEEE Trans Elect Dev1992,39,6:1
12Density- gradient analysis of MOS tunneling显示文摘ANCONA M G YU Z DUTT'ON R W 2000IEEE Trans Elect Dev2000,47,12:1
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