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16篇 您的检索式:作者名="Roccaforte F"
    题名 作者 年代 出处 被引量
1Temperature dependence of the specific resistance in Ti-AI-Ni-Au contacts on n-type GaN显示文摘Iucolano F Roccaforte F Alberti A 2006J Appl Phys2006,100,12:1
2Experimental eval- uation of different passivation layers on the performance of 3 kV 4H-SiC BJTs显示文摘Eriksson J Weng M H Roccaforte F 2010Mater Sci Forum2010,677,:1
3Photocurrent gain in 4H-SiC interdigit schottky UV detectors with a thermally grown oxide layer 显示文摘SCIUTO A ROCCAFORTE F FRANCO S D 2007Applied Physics Letters2007,90,22:1
4Temperature dependence of the specific resistance in Ti-Al-Ni- Au contacts on n-type GaN显示文摘Iucolano F Roccaforte F Alberti A 2006J Appl Phys2006,100,12:1
5Pho-tocurrent gain in 4H-SiC interdigit schottky UV detectorswith a thermally grown oxide layer显示文摘SCIUTO A ROCCAFORTE F FRANCO S D 2007Appl Phys Lett2007,90,22:1
6Structural and electrical characterisation of titanium and nickel silicide contacts on silicon carbide显示文摘 ROCCAFORTE F MAKHTARI A 2002Microelectron Eng2002,60,12:1
7High responsivity 4H-SiC schottky UV photodiodes based on the pinch off surface effect显示文摘Sciuto A Roccaforte F Franco S D 2006Appl Phys Lett2006,89,08:1
8Highly reproducible ideal SiC Schottky rectifiers:effects of surface preparation and thermal annealing on the Ni/6H-SiC barrier height显示文摘ROCCAFORTE F la via F RAINERI V 2003Applied Physics:A Materials Science & Processing2003,77,6:1
9Nanoscale carrier transport in Ti/A1/Ni/Au Ohmic contacts on AIGaN epilayers grown on Si(111)显示文摘F Roccaforte F Iueolano F Giannazzo 2006Applied Physics Letters2006,89,2:1
10Structural and electrical characterisation of titanium and nickel silicide contacts on silicon carbide显示文摘la via F ROCCAFORTE F MAKHTARI A 2002Microelectronic Engineering2002,60,12:1
11Impact of the morphological and electrical properties of SiO2/4H SiC interfaces on the behavior of 4H SiC MOSFET显示文摘ROCCAFORTER F FIORENZA P GIANNAZZO F 2013ECS Journal of Solid State Science and Technology2013,2,8:1
12Improvement of high temperature stability of Nickel contacts on n-type 6H-SiC显示文摘Roccaforte F Via F La 2001Appl Surf Sci2001,184,:1
13Highly reproducible ideal SiC Schottkyrectifiers: effects of surface preparationand thermal annealing on the Ni/6H-SiC barrier height 显示文摘ROCCAFORTE F LA V F RAINERI V 2003Appl Phys A2003,77,6:1
14Pho- tocurrent gain in 4H-SiC interdigit schottky UV detectors with a thermally grown oxide layer 显示文摘SCIUTO A ROCCAFORTE F FRANCO S D 2007Appl Phys Lett2007,90,22:1
15Ohmic contacts to SiC显示文摘Roccaforte F La Via F Raineri V 2005Int J of High Speed Electronics and Systems2005,15,4:1
16Crystallization mechanism of amorphous silicon carbide 显示文摘CALCAGNO L MUSUMECI P ROCCAFORTE F 2001Ap- plied Surface Science2001,184,1:1
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