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9篇 您的检索式:作者名="PALOURA E"
    题名 作者 年代 出处 被引量
1On the effect of bonded hydrogen in the local microstructure of PECVD SiNx:H films 显示文摘Paloura E C Kuo Y Braun W 1995Physica B1995,,:1
2Study of annealing induced devitrification of stabilized industrial waste glassesby means of micro-X-ray fluorescence mapping and absorption fine structure spectroscopy 显示文摘Pinakidou F Katsikini M Paloura E C Kavouras P Komninou P Karakostas T Erko A 2005Journal of Non- Crystalline Solids2005,351,3032:1
3Nanostructural Characterization oi TiN-Cu Using EXAFS Spectroscopy显示文摘PINAKIDOU F PALOURA E MATENOGLOU G M 2010Surface and Coatings Technology2010,204,2:1
4Silicon nitride films grown on silicon below 300 in low power nitrogen plasma 显示文摘Paloura E Nauka K Lagowski J 1986Appl Phys lett1986,49,:1
5Raman and X-ray absorption near-edge structure characterization of Ga N implanted with O,Ar,Xe,Te and Au显示文摘KATSIKINI M ARVANITIDIS J PALOURA E C 2007Opt Mater2007,29,18:1
6Raman study of Mg,Si,O,and N implanted GaN显示文摘Katsikini M Papagelis K Paloura E C 2003Journal of Applied Physics2003,94,7:1
7Silicon nitride films grown on silicon below 300 in low power nitrogen plasma 显示文摘PALOURA E NAUKA K LAGOWSKI J 1986Appl Phys Let1986,49,:1
8Silicon nitride films grown on silicon below 300 in low power nitrogen plas- ma显示文摘PALOURA E NAUKA K LAGOWSKI 1986J Appl Phys lett1986,49,2:1
9Nanostructuml Characterization of TiN-Ni Films: A XAFS Study显示文摘Pinakidou F Katsikini M Paloura E C 2011Materi- als Science and Engineering2011,176,:1
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