| 1 | Simultaneous microwave characterization of wafer-level optoelectronic transceiver chips based on photonic sampling and mapping显示文摘Photonic integrated circuits(PICs)promise future parallelism growths of high-performance communication,computation,and offer unprecedented bandwidth scalability with reduced power consumption as a viable replacement for an electrical wire with an optoelectronic transceiver consisting of a transmitter and a receiver integrated on the same wafer.This wafer-level photonic integration,however,raises challenges for processing optical-electrical(O-E)and electricaloptical(E-O)characterization,which is crucial in chip fabrication and optimization[1]. | Yutong HE Xinhai ZOU Ying XU Zhihui LI Naidi CUI Junbo FENG Yali ZHANG Zhiyao ZHANG Shangjian ZHANG Yong LIU Ninghua ZHU | 2024 | Science China(Information Sciences)2024，67，2： | 0 |
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