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您的检索式：作者名="Muhammad Zakria"
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| 1 | A Potential Disease Susceptibility Gene CsLOB of Citrus Is Targeted by a Major Virulence Effector PthA of Xanthomonas citri subsp, citri显示文摘Dear Editor, Citrus bacterial canker (CBC),one of the most destructive diseases of citrus,has a severe economic impact on citrus industries in tropical and subtropical countries (Das,2003).It has been widely known that Xanthomonas cirri subsp.cirri (Xcc) causes the CBC by transferring the type-Ⅲ effectors (T3SEs) to the interior of the plant cell through type-Ⅲ secretion system (T3S) to modulate transcription of host plants to trigger CBC disease (Schaad et al.,2006).Pathotype A,the Asiatic form of Xcc,has a wide host range,is pathogenic on almost all citrus varieties,and contains a major virulence gene pthA encoding a T3S-secreted transcriptional activator-like effector (TALE) that promotes cellular hypertrophy (Al-Saadi et al.,2007).However,the susceptibility gene in citrus being responsible for the CBC and matching PthA of Xcc is largely unknown. | Zheng Li Lifang Zou Gang Ye Li Xiong Zhiyuan Ji Muhammad Zakria Ni Hong Guoping Wang Gongyou Chen | 2014 | Molecular Plant2014，7，5： | 9 |
| 2 | Effect of Cumulative Nanosecond Laser Pulses on the Plasma Emission Intensity and Surface Morphology of Pt-and Ag-Ion Deposited Silicon显示文摘In this work, the laser induced plasma plume characteristics and surface morphology of Pt-and Ag-ion deposited silicon were studied. The deposited silicon was exposed to cumulative laser pulses. The plasma plume images produced by each laser shot were captured through a computer controlled image capturing system and analyzed with image-J software. The integrated optical emission intensity of both samples showed an increasing trend with increasing pulses. Ag-ion deposited silicon showed higher optical emission intensity as compared to Pt-ion deposited silicon, suggesting that more damage occurred to the silicon by Ag ions, which was confirmed by SRIM/TRIM simulations. The surface morphologies of both samples were examined by optical microscope showing thermal, exfoliational and hydrodynamical sputtering processes along with the re-deposition of the material, debris and heat affected zones' formation. The crater of Pt-ion deposited silicon was deeper but had less lateral damage than Agion deposited silicon. The novel results clearly indicated that the ion deposited silicon surface produced incubation centers, which led to more absorption of incident light resulting into a higher emission intensity from the plasma plume and deeper crater formation as compared to pure silicon. The approach can be effectively utilized in the laser induced breakdown spectroscopy technique, which endures poor limits of detection. | Khurram SIRAJ Muhammad Zakria BUTT Muhammad KHALEEQ-UR-RAHMAN Muhammad Shahid RAFIQUE Saima RAFIQUE FAKHAR-UN-NISA | 2012 | Plasma Science and Technology2012，14，4： | 0 |
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