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| 1 | Synthesis of multilevel multiplexer circuits for incompletely specified multioutput Boolean functions with mapping to multiplexer based FPGA's 显示文摘 | Schafer Ingo Perkowski Marek A | 1993 | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems1993，20，9： | 1 |
| 2 | Novel Quantum Algorithms to Minimize Switching Functions Based on Graph Parti显示文摘After Google reported its realization of quantum supremacy,Solving the classical problems with quantum computing is becoming a valuable research topic.Switching function minimization is an important problem in Electronic Design Automation(EDA)and logic synthesis,most of the solutions are based on heuristic algorithms with a classical computer,it is a good practice to solve this problem with a quantum processer.In this paper,we introduce a new hybrid classic quantum algorithm using Grover’s algorithm and symmetric functions to minimize small Disjoint Sum of Product(DSOP)and Sum of Product(SOP)for Boolean switching functions.Our method is based on graph partitions for arbitrary graphs to regular graphs,which can be solved by a Grover-based quantum searching algorithm we proposed.The Oracle for this quantum algorithm is built from Boolean symmetric functions and implemented with Lattice diagrams.It is shown analytically and verified by simulations on a quantum simulator that our methods can find all solutions to these problems. | Peng Gao Marek Perkowski Yiwei Li Xiaoyu Song | 2022 | Computers, Materials & Continua2022，，3： | 0 |
| 3 | An Extended Approach for Generating Unitary Matrices for Quantum Circuits显示文摘In this paper,we do research on generating unitary matrices for quantum circuits automatically.We consider that quantum circuits are divided into six types,and the unitary operator expressions for each type are offered.Based on this,we propose an algorithm for computing the circuit unitary matrices in detail.Then,for quantum logic circuits composed of quantum logic gates,a faster method to compute unitary matrices of quantum circuits with truth table is introduced as a supplement.Finally,we apply the proposed algorithm to different reversible benchmark circuits based on NCT library(including NOT gate,Controlled-NOT gate,Toffoli gate)and generalized Toffoli(GT)library and provide our experimental results. | Zhiqiang Li Wei Zhang Gaoman Zhang Juan Dai Jiajia Hu Marek Perkowski Xiaoyu Song | 2020 | Computers, Materials & Continua2020，，3： | 0 |
| 4 | Effectiveness Assessment of the Search-Based Statistical Structural Testing显示文摘Search-based statistical structural testing(SBSST)is a promising technique that uses automated search to construct input distributions for statistical structural testing.It has been proved that a simple search algorithm,for example,the hill-climber is able to optimize an input distribution.However,due to the noisy fitness estimation of the minimum triggering probability among all cover elements(Tri-Low-Bound),the existing approach does not show a satisfactory efficiency.Constructing input distributions to satisfy the Tri-Low-Bound criterion requires an extensive computation time.Tri-Low-Bound is considered a strong criterion,and it is demonstrated to sustain a high fault-detecting ability.This article tries to answer the following question:if we use a relaxed constraint that significantly reduces the time consumption on search,can the optimized input distribution still be effective in faultdetecting ability?In this article,we propose a type of criterion called fairnessenhanced-sum-of-triggering-probability(p-L1-Max).The criterion utilizes the sum of triggering probabilities as the fitness value and leverages a parameter p to adjust the uniformness of test data generation.We conducted extensive experiments to compare the computation time and the fault-detecting ability between the two criteria.The result shows that the 1.0-L1-Max criterion has the highest efficiency,and it is more practical to use than the Tri-Low-Bound criterion.To measure a criterion’s fault-detecting ability,we introduce a definition of expected faults found in the effective test set size region.To measure the effective test set size region,we present a theoretical analysis of the expected faults found with respect to various test set sizes and use the uniform distribution as a baseline to derive the effective test set size region’s definition. | Yang Shi Xiaoyu Song Marek Perkowski Fu Li | 2022 | Computers, Materials & Continua2022，，2： | 0 |
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