| 1 | Time-of-flight methodologies with large-area diamond detectors for ion characterization in laser-driven experiments显示文摘The time-of-flight technique coupled with semiconductor detectors is a powerful instrument to provide real-time characterization of ions accelerated because of laser-matter interactions.Nevertheless,the presence of strong electromagnetic pulses(EMPs)generated during the interactions can severely hinder its employment.For this reason,the diagnostic system must be designed to have high EMP shielding.Here we present a new advanced prototype of detector,developed at ENEA-Centro Ricerche Frascati(Italy),with a large-area(15 mm×15 mm)polycrystalline diamond sensor having 150 μm thickness.The tailored detector design and testing ensure high sensitivity and,thanks to the fast temporal response,high-energy resolution of the reconstructed ion spectrum.The detector was offline calibrated and then successfully tested during an experimental campaign carried out at the PHELIX laser facility(E_(L)~100 J,τ_(L)=750 fs,I_(L)(1-2.5)×10^(19)W/cm^(2))at GSI(Germany).The high rejection to EMP fields was demonstrated and suitable calibrated spectra of the accelerated protons were obtained. | M.Salvadori G.Di Giorgio M.Cipriani M.Sciscio C.Verona P.L.Andreoli G.Cristofari R.De Angelis M.Pillon N.E.Andreev P.Antici N.G.Borisenko D.Giulietti M.Migliorati O.Rosmej S.Zahter F.Consoli | 2022 | High Power Laser Science and Engineering2022，10，1： | 1 |
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