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6篇 您的检索式：作者名="David P Field"

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		题名	作者	年代	出处	被引量
	1	Abdominal obesity adversely affects bone mass in children显示文摘AIM To determine the effect of childhood obesity and insulin resistance on bone health. METHODS We conducted a cross sectional study in pubertal adolescents and young adults 13-20 years old who were either overweight/obese or normal weight. Participants were Tanner 3 or above for pubertal stage, and had fasting blood work done to measure glucose, insulin, C-reactive protein and lipid levels. Homeostatic model of insulin resistance(HOMA-IR) was calculated using the formula(Fasting Blood Glucose *Insulin/405). Body composition and bone mineral density were measured using dual energy X-ray absorptiometry(DXA; Hologic QDR 4500, Waltham, MA, United Kingdom). RESULTS Percent trunk fat was associated inversely with whole body bone mineral content(BMC), whereas HOMA-IR was associated positively with whole body BMC.CONCLUSION Our results suggest that abdominal adiposity may have an adverse effect on whole body bone parameters and that this effect is not mediated by insulin resistance.	Sowmya Krishnan Michael P Anderson David A Fields Madhusmita Misra	2018	World Journal of Clinical Pediatrics2018，7，1：	3
	2	Microstructure Mapping of Interconnects by Orientation Imaging Microscopy 显示文摘	David P Field David J Dingley	1996	Journal of Mlectronic Material1996，25，：	1
	3	Microstructure Mapping of Interconnects by Orientation Imaging Microscopy显示文摘	David P Field David J Dingley	1996	Journal of Mlectronic Material1996，25，：	1
	4	A natural flavonoid present in unripe plantain banana pulp ( Musa sapientum L. var. paradisiaca ) protects the gastric mucosa from aspirin-induced erosions显示文摘	David A Lewis William N Fields Graham P Shaw	1999	Journal of Ethnopharmacology1999，，3：	1
	5	Microstructure Mapping of Interconnects by Orientation Imaging Microscopy显示文摘	David P Field David J Dingley	1996	Journal of Electronic Material1996，25，：	1
	6	Mierostrueture Mapping of Interconnects by Orientation Imaging Microscopy显示文摘	David P Field David J Dingley	1996	Journal of Mlectronic Material1996，25，：	1

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