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1篇 您的检索式：作者名="Corey Stambaugh"

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		题名	作者	年代	出处	被引量
	1	Position-resolved Surface Characterization and Nanofabrication Using an Optical Microscope Combined with a Nanopipette/Quartz Tuning Fork Atomic Force Microscope显示文摘In this work, we introduce position-resolved surface characterization and nanofabrication using an optical microscope(OM) combined with a nanopipette-based quartz tuning fork atomic force microscope(nanopipette/QTF-AFM) system. This system is used to accurately determine substrate position and nanoscale phenomena under ambient conditions. Solutions consisting of 5 nm Au nanoparticles, nanowires, and polydimethylsiloxane(PDMS) are deposited onto the substrate through the nano/microaperture of a pulled pipette. Nano/microscale patterning is performed using a nanopipette/QTF-AFM, while position is resolved by monitoring the substrate with a custom OM. With this tool, one can perform surface characterization(force spectroscopy/microscopy) using the quartz tuning fork(QTF) sensor. Nanofabrication is achieved by accurately positioning target materials on the surface, and on-demand delivery and patterning of various solutions for molecular architecture.	Sangmin An Baekman Sung Haneol Noh Corey Stambaugh Soyoung Kwon Kunyoung Lee Bongsu Kim Qhwan Kim Wonho Jhe	2014	Nano-Micro Letters2014，6，1：	2

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