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14篇 您的检索式：作者名="CABARROCAS P R"

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		题名	作者	年代	出处	被引量
	1	Study of the effects of different fractions of large grains of Ilc-Si ' H ' F films on the infrared absorption on thin film solar cells显示文摘	Moreno M Boubekri R Cabarrocas P R	2012	Solar Energy Materials and Solar Cells2012，1620，：	1
	2	Measurement of stress gradients in hydrogenated microcrystalline silicon thin films using Raman spectroscopy显示文摘	Paillard V Puech P Cabarrocas P R	2002	J Non-Cryst Solids2002，299，302：	1
	3	Structure and hydrogen content of polymorphous silicon thin films studied by spectroscopic ellipsometry and nu- clear measurements 显示文摘	MORRAL A F CABARROCAS P R CLERC C	2004	Physical Review: B2004，69，12：	1
	4	Measurement ofstress gradients in hydrogenated microcrystalline sili-con thin film using Raman spectroscopy显示文摘	Paillard V Puech P Cabarrocas P R	2002	Journal ofNon-Crystalline Solids2002，，2：	1
	5	Defect states on the surfaces of a p-type c-Si wafer and how they control the performance of a double heterojunction solar cell显示文摘	Datta A Damon-Lacoste J Cabarrocas P R		0，，：	1
	6	A- bout the efficiency limits of heretojunction solar cells显示文摘	Damon-lacoste J Cabarrocas P R I Chatterjee P	2006	J Non-Cryst Solids2006，352，920：	1
	7	Trapping of plasma produced nanoerystalline Si particles on a low temperature substrate显示文摘	Chaabane N Cabarrocas P R Vach H	2004	Journal of Non-Crystalline Solids2004，3383，40：	1
	8	The open-circuit voltage in microcrystalline silicon solar cells of different degrees of crystallinity 显示文摘	Nath M Cabarrocas P R Johnson E V	2008	Thin Solid Films2008，516，：	1
	9	Determination of the Mobility Gap of Microcrystalline Silicon and of the Band Discontinuities at the Amorphous/ microcrystalline Silicon Interface Using In Situ Kelvin Probe Technique显示文摘	Hamma S Cabarrocas P R I	1999	Applied Physics Letters1999，74，21：	1
	10	Growth and optoelectronic properties of polymorphous silicon thin films显示文摘	Cabarrocas P R I Morral A F I Poissant Y	2002	Thin Solid Films2002，，：	1
	11	显示文摘	Godet C Cabarrocas P R I	1996	J Appl Phys1996，80，：	1
	12	Structure and hydrogen content of polymorphous silicon thin films studied by spectroscopic ellipsometry and nuclear measurements 显示文摘	Morral A F Cabarrocas P R	2004	Physical Review B2004，69，12：	1
	13	Determination of the conduction band offset between hy- drogenated amorphous silicon and crystalline silicon from surface inversion layer conductance measurements显示文摘	Kleider J P Gudovskikh A S Cabarrocas P R	2008	Appl Phys Lett2008，92，16：	1
	14	Ion Bombardment Effects on the Microcrystalline Silicon Growth Mechanisms and Structure显示文摘	Kalache B Kosarev A I Vanderhaghen R Roca Cabarrocas P	2002	Journal of Non-Crystalline Solids2002，，：	1

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