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9篇 您的检索式:期刊名="Surf. Interface Anal"
    题名 作者 年代 出处 被引量
1Sputtering‐induced surface roughness of polycrystalline Al films and its influence on AES depth profiles显示文摘1998Surf. Interface Anal1998,,1:1
2From depth resolution to depth resolution function: refinement of the concept for delta layers, single layers and multilayers显示文摘SiegfriedHofmann 1999Surf. Interface Anal1999,,9:1
3Peak or centroid — which parameter is better suited for quantifying apparent marker locations in low‐energy sputter depth profiling with reactive primary ion beams?显示文摘K.Wittmaack E.Hammerl I.Eisele S. B.Patel 2001Surf. Interface Anal2001,,9:1
4Quantitative analysis of conductive coatings by radiofrequency‐powered glow discharge optical emission spectrometry: hydrogen, d.c. bias voltage and density corrections显示文摘RichardPayling JohannMichler MaxAeberhard 2002Surf. Interface Anal2002,,6:1
5Influence of nonstationary atomic mixing on depth resolution in sputter depth profiling显示文摘J. Y.Wang Y.Liu S.Hofmann J.Kovac 2012Surf. Interface Anal2012,,5:1
6Stress corrosion cracking behaviour of conventional and innovative aluminium alloys for aeronautic applications显示文摘A. Astarita C. Bitondo A. Squillace E. Armentani F. Bellucci 2013Surf. Interface Anal2013,,:1
7Electrochemically controlled detection of adrenaline on poly(2‐aminobenzylamine) thin films by surface plasmon resonance spectroscopy and quartz crystal microbalance显示文摘Sopis Chuekachang Rapiphun Janmanee Akira Baba Sukon Phanichphant Saengrawee Sriwichai Kazunari Shinbo Keizo Kato Futao Kaneko Nobuko Fukuda Hirobumi Ushijima 2013Surf. Interface Anal2013,,11:1
8An analytical depth resolution function for the MRI model显示文摘Y. Liu S. Hofmann J. Y. Wang 2013Surf. Interface Anal2013,,11:1
9Quantification of AES depth profiling data of polycrystalline Al films with Gaussian and non‐Gaussian surface height distributions显示文摘W. Jian Y. Liu X. Y. Wang S. P. Rao S. Hofmann J. Y. Wang 2013Surf. Interface Anal2013,,7:1
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