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	题名	作者	年代	出处	被引量
1	A multimedia, multiple pathway risk assessment of atrazine: the impact of age differentiated exposure including joint uncertainty and variability显示文摘	DeborahH. Bennett W.E. Kastenberg T.E. McKone	1998	Reliability Engineering and System Safety1998，，2：	3
2	Variance-based sensitivity indices for models with dependent inputs显示文摘	Thierry A. Mara Stefano Tarantola	2011	Reliability Engineering and System Safety2011，，：	3
3	Survey of sampling-based methods for uncertainty and sensitivity analysis显示文摘	J.C. Helton J.D. Johnson C.J. Sallaberry C.B. Storlie	2005	Reliability Engineering and System Safety2005，，10：	2
4	Noise as a diagnostic and prediction tool in reliability physics 显示文摘	Jevtic M M	1995	Microelectronics Reliability1995，35，：	2
5	The correlation between the low-frequency electrical noises of high-power quantum well lasers and devices surface non-radiative current 显示文摘	HU Gui-jun SHI Jia-wei ZHANG Su-mei	2002	Microelectronics Reliability2002，42，：	2
6	An improved approach and experimented results of a low-frequency noise measurement technique used for reliability estimation of diode lasers 显示文摘	SHI Jia-wei JIN En-shun MA Jing	1994	Microelectronics Reliability1994，34，1：	2
7	Reliability engineering: Old problems and new challenges显示文摘	E. Zio	2008	Reliability Engineering and System Safety2008，，2：	2
8	Practical experience with a data collection project: the OREDA project显示文摘	Helge A. Sandtorv Per Hokstad David W. Thompson	1996	Reliability Engineering and System Safety1996，，2：	2
9	Safety analysis, synthesis using fuzzy sets and evidential reasoning显示文摘	WANG J YANG J B and SEN P	1995	Reliability engineering and system safety1995，47，：	2
10	Applications of sensitivity analysis to combustion chemistry显示文摘	Tamás Turányi	1997	Reliability Engineering and System Safety1997，，1：	2
11	Analysis of step stress accelerated-life-test data: A new approach显示文摘	Tang L C	1996	IEEE Transaction on Reliability1996，45，1：	2
12	Light emitting diodes reliability review显示文摘	Moon-Hwan Chang Diganta Das P.V. Varde Michael Pecht	2011	Microelectronics Reliability2011，，5：	2
13	A variance-based sensitivity index function for factor prioritization显示文摘	Douglas L. Allaire Karen E. Willcox	2011	Reliability Engineering and System Safety2011，，：	2
14	Probabilistic reasoning based on dynamic causality tree/diagrams 显示文摘	Zhang Q	1994	Reliability Engineering and System Safety1994，46，3：	2
15	Probabilistic optimization of welded joints maintenance verus fatigue and fracture显示文摘	Luki c' M Cremona C	2001	Reliability Engineering and System Safety2001，72，3：	2
16	Back side optical beam induced current method for the localization of electric field enhancements in edge termination structures of power semiconductor devices 显示文摘	Soelkner G Kreutle J Quincke J	2000	Microelectronics Reliability2000，40，810：	2
17	Most-vital edge of a graph with respect to spanning trees显示文摘	RAO V	1998	IEEE Transactions on Reliability1998，47，1：	1
18	Early failure analysis of machining eenters:a case study 显示文摘	Wang Yiqiang Jia Yazhou Jiang Weiwei	2001	Reliability Engineering and System Safety2001，72，3：	1
19	A load-capacity interference model for commonmode failures in 1-out-of-2: G systems显示文摘	Lewis E E	2001	IEEE Transaction on Reliability2001，50，1：	1
20	Distribution of time between failures of machining center based on type Ⅰ censored data显示文摘	Dai Y Zhou Y F Jia Y Z	2003	Reliability Engineering and System Safety2003，79，3：	1

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