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13篇 您的检索式:期刊名="Microeleetronies Reliability"
    题名 作者 年代 出处 被引量
1Influence of Ag micro-particle additions on the microstructure, hardness and tensile properties of Sn-gZn binary eutectic solder alloy显示文摘Ahmed M Fouzder T Sharif A 2010Microeleetronies Reliability2010,50,8:1
2Numerical a- nalysis of thermo-mechanieal and mobility effects for 28 nm node and beyond: comparison and design consequences over bumping technologies 显示文摘Fiori V Ewuame K A Gallois-Garreignot S 2014Microeleetronies Reliability2014,54,4:1
3Some new reliability problems and results for one-unit repairable system 显示文摘TANG Y H 1999Microeleetronies and reliability1999,36,4:1
4Solder-joint reliability of HVQFN package subjected to thermal cycling显示文摘de Vries J Jansen M Van Driel W 2009Microeleetronies Reliability2009,49,3:1
5Reliability analysis of M/G/1 queuing system with repairable service station of reliability series structure显示文摘CAO Jin-hua 1994Microeleetronies & Reliability1994,34,:1
6A reliability model for SAC solder covering isothermal mechanical cycling and thermal cycling conditions显示文摘Herkommer D Punch J Reid M 2010Microeleetronies Reliability2010,50,1:1
7Crack mechanism in wire bonding joinls显示文摘Ramminger S Turkes P Wachulka G 1998Microeleetronies and Reliability1998,38,:1
8The formation and growth of intermetallic compounds and shear strength at SnZn solder/Au-Ni-Cu interfaees显示文摘KimK S Ryu K W Yu C H 2005Microeleetronies Reliability2005,45,:1
9DynamicNBTI lifetime model for inverter-like waveform显示文摘Tan SS Chen TP Ang C H 2005Microeleetronies Reliability2005,45,:1
10Mechanical reliability of Sn-rich Au-Sn/Ni flip chip solder joints fabricated by sequentialelectroplating method显示文摘Yoon J W Chun H S Noh B I 2008Microeleetronies Reliability2008,48,:1
11Experimental study and life prediction on high cycle vibration fatigue in BGA packages 显示文摘LIU X SOOKLAL V K 2006Microeleetronies Reliability2006,46,8:1
12LabVIEW7 Digital Signal Processing and Digital Communications显示文摘CORY L C 2008Microeleetronies Reliability2008,48,3:1
13Using intuitionistic fuzzy sets for fault-tree analysison printed circuit board assembly显示文摘Ming-Hung Shu Ching-Hsue Cheng Jing-Rong Chang 2006Microeleetronies Reliability2006,,46:1
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