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153篇 您的检索式:期刊名="Microelectron J"
    题名 作者 年代 出处 被引量
1显示文摘Kang K Daneshvar K Tsu R 2004Microelectron J2004,35,8:1
2Micro cantilever probe array integrated with piezoresistive sensor显示文摘 Li Xinxin Wang Yuelin 2004J Microelectron2004,35,5:1
3An eficientreconfigurable multier architecture for GF(2) 显示文摘KITSOS P THEODORIDIS G KOUFOPAVLOU 2003Microelectronics J2003,34,10:1
4Evaluation of analytical models for thermal analysis and design of electronic packages 显示文摘Moghaddam S Rada M Shooshtari A 2003Microelectron J2003,34,:1
5An efficient reconfigurable multiplier architecture for GF (2^m) 显示文摘Kitsos P Theodoridis G Koufopavlou O 2003Microelectronics J2003,34,10:1
6Extreme ultraviolet carrier-frequency shearing interferometry of a lithographic four- mirror optical system显示文摘Naulleau P P Goldberg K A Bokor J 2000J Vacuum Science : Technology B: Microelectronics and Nanometer Structures2000,18,6:1
7The application of all-pass filters in the design of multiphase sinusoidal systems显示文摘GIFT S J G 2000Microelectron J2000,31,:1
8Recent development of polyfluorene - based RGB materials for light - emitting diodes 显示文摘WU W INBASEKARAN M HUDACK M 2004Microelectron J2004,35,:1
9Current-mode multiphase oscillator using current followers显示文摘ABUELMA'ATTI M T 1994Microelectron J1994,25,11:1
10Study on the Al/silicon rich oxide/Si structure as a surge suppressor, DC,frequency responcy response and modeling 显示文摘Aceves M Pedraza J Reynoso-Hermandez A 1999Microelectron J1999,30,:1
11Photovoltaic properties of multi-walled carbon nanotubes deposited on n-doped silicon 显示文摘Arena A Donato N Saitta G 2008Microelectron J2008,39,12:1
12A comparison of microstrip models to low temperature co-fired ceramic-silver microstrip measurements 显示文摘Shapiro A A Mecartney M L Lee H P 2002Microelectron J2002,33,:1
13显示文摘Zhang T J Gu H S Liu J H 2003J Microelectron Eng2003,66,:1
14Investigation on doping behavior of copper in ZnO thin film显示文摘Kim G H Ahn K D L Lee B D 2009Microelectronics J2009,40,:1
15Structural, electrical and optical properties of ZnO films deposited by sol-gel method显示文摘Sahal M Hartiti B Ridah A 2008Microelectron J2008,39,12:1
16Development of a rapid and automated TEM sample preparation method in semiconductor failure analysis and the study of the relevant TEM artifact显示文摘 Tee S F Tay C L 2001Microelectron J2001,32,3:1
17Characteristics of SiCN microstructures for harsh environment and high-power MEMS applica- tions显示文摘CHUNG G S 2007Microelectronics J2007,38,89:1
18Advanced etching of silicon based on deep reactive ion etching for silicon high aspect ratio microstructures and three-dimensional micro-and nanostructures显示文摘MARTY F ROUSSEAU L SAADANY B 2005J Microelectronics2005,36,7:1
19A process and temperature compensated current reference circuit in CMOS process显示文摘Dave M Baghini M S Sharma D K 2012Microelectron J2012,43,2:1
20Bipolar transistor with quantum well base 显示文摘S Mil' SHTEIN CHURl A PALAM J 2008Microelectronics J2008,39,:1
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