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| 1 | A straightforward spectral emissivity estimating method based on constructing random rough surfaces显示文摘Spectral emissivity is an essential and sensitive parameter to characterize the radiative capacity of the solid surface in scientific and engineering applications,which would be non-negligibly affected by surface morphology.However,there is a lack of assessment of the effect of roughness on emissivity and a straightforward method for estimating the emissivity of rough surfaces.This paper established an estimating method based on constructing random rough surfaces to predict rough surface(Geometric region)emissivity for metal solids.Based on this method,the emissivity of ideal gray and non-gray body surfaces was calculated and analyzed.The calculated and measured spectral emissivities of GH3044,K465,DD6,and TC4 alloys with different roughness were compared.The results show that the emissivity increases with the roughness degree,and the enhancement effect weakens with the increase of roughness or emissivity due to the existing limit(emissivityε=1.0).At the same time,the roughness would not change the overall spectral distribution characteristics but may attenuate the local features of the spectral emissivity.The estimated results are in good agreement with the experimental data for the above alloys'rough surfaces.This study provides a new reliable approach to obtaining the spectral emissivity of rough surfaces.This approach is especially beneficial for measuring objects in extreme environments where emissivity is difficult to obtain.Meanwhile,this study promotes an understanding of surface morphology's effect mechanism on emissivity. | Zezhan Zhang Mengchao Chen Lichuan Zhang Hongzu Li Hairui Huang Zilong Zhang Peifeng Yu Yi Niu Shan Gao Chao Wang Jing Jiang | 2023 | Light(Science & Applications)2023，12，12： | 0 |
| 2 | 超精密平面光学元件检测技术显示文摘超精密光学元件是决定高端装备性能的核心元件,在大科学装置、精密仪器等领域中被广泛应用。对光学元件进行高精度检测是保证元件质量的重要途径。光学检测技术因具有非破坏性、高精度而成为光学元件检测的有效技术。首先,对超精密光学元件主要检测技术进行了综述,重点介绍技术原理、研究现状和应用瓶颈;其次,针对光学检测技术中的相位解调问题,以波长移相测量技术为例,结合超精密平面光学元件检测,概述了相位解调算法的原理与实现过程,并对其性能进行综合评估;最后,展望光学元件检测技术的未来发展趋势。 | 周永昊 常林 何婷婷 于瀛洁 | 2023 | 自然杂志2023，45，3： | 0 |
| 3 | Thin-film neural networks for optical inverse problem显示文摘The thin-film optical inverse problem has attracted a great deal of attention in science and industry,and is widely applied to optical coatings.However,as the number of layers increases,the time it takes to extract the parameters of thin films drastically increases.Here,we introduce the idea of exploiting the structural similarity of all-optical neural networks and applied it to the optical inverse problem.We propose thin-film neural networks(TFNNs)to efficiently adjust all the parameters of multilayer thin films.To test the performance of TFNNs,we implemented a TFNN algorithm,and a reflectometer at normal incidence was built.Operating on multilayer thin films with 232 layers,it is shown that TFNNs can reduce the time consumed by parameter extraction,which barely increased with the number of layers compared with the conventional method.TFNNs were also used to design multilayer thin films to mimic the optical response of three types of cone cells in the human retina.The light passing through these multilayer thin films was then recorded as a colored photo. | Lingjie Fan Ang Chen Tongyu Li Jiao Chu Yang Tang Jiajun Wang Maoxiong Zhao Tangyao Shen Minjia Zheng Fang Guan Haiwei Yin Lei Shi Jian Zi | 2021 | Light(Advanced Manufacturing)2021，2，4： | 0 |
| 4 | 多层微纳薄膜的高精度检测技术进展显示文摘在半导体、机械加工等行业中广泛应用的多层微纳薄膜通常是由数个纳米厚度的单层膜叠加形成的,在其制造过程中,由于工艺条件所限,薄膜厚度的均匀性会出现误差,进而影响其性能。因此薄膜厚度的准确测量至关重要,亟需一种无损、高精度、快速的检测技术对薄膜的厚度及其均匀性进行测量、检测。回顾近年来多层膜在不同领域的应用现状,分析了目前应用于多层膜厚度测量的技术(如X射线衍射等)及其不足,以及椭圆偏振法技术的研究进展,最后介绍了机器学习在厚度测量中的应用,并对未来机器学习与测量结合的前景进行了展望。 | 祝源浩 董佳琦 宋有建 胡明列 | 2023 | 计测技术2023，43，1： | 0 |
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