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| 1 | Mid-wavelength InAs/GaSb type-Ⅱ superlattice barrier detector with nBn design and M barrier显示文摘This study reports the performance of an InAs/GaSb type-Ⅱ superlattices(T2SLs) detector with nBn structure for mid-wavelength infrared(MWIR) detection. An electronic band structure of M barrier is calculated using 8-band k·p method, and the nBn structure is designed with the M barrier. The detector is prepared by wet etching, which is simple in manufacturing process. X-ray diffraction(XRD) and atomic force microscope(AFM) characteristics indicate that the detector material has good crystal quality and surface morphology. The saturation bias of the spectral response measurements at 77 K is 300 m V, and the device is promising to work at a temperature of 140 K. Energy gap of T2SLs versus temperature is fitted by the Varshni curve, and zero temperature bandgap Eg(0), empirical coefficients α and β are extracted. A dark current density of 3.2×10-5A/cm2and differential resistance area(RA) product of 1.0×104Ω·cm2are measured at 77 K. The dominant mechanism of dark current at different temperature ranges is analyzed. The device with a 50% cutoff wavelength of 4.68 μm exhibits a responsivity of 0.6 A/W, a topside illuminated quantum efficiency of 20% without antireflection coating(ARC), and a detectivity of 9.17×1011cm·Hz1/2/W at 77 K and 0.3 V. | LIU Zhaojun ZHU Lianqing LU Lidan DONG Mingli ZHANG Dongliang ZHENG Xiantong | 2023 | Optoelectronics Letters2023，19，10： | 0 |
| 2 | 面向MOCVD生长InAs/GaSb超晶格红外探测的InAs衬底表面制备显示文摘采用全反射X射线荧光光谱(total reflection X-ray fluorescence,TXRF)和X射线光电子能谱(X-ray photo-electron spectroscopy,XPS)检测方法研究InAs衬底化学机械抛光后经过不同湿法化学溶液联合作用后衬底表面的金属杂质残留浓度和氧化物组分的变化。湿法化学清洗后的InAs表面检测到金属杂质Si,K和Ca,它们的浓度随溶液组合的变化而变化。金属杂质残留浓度较高的InAs衬底表面同时也测得较多粒径为80 nm的颗粒。提出了一种行之有效的InAs衬底湿化学清洗方法,可制备出金属杂质残留少、颗粒少、氧化层薄InAs衬底表面,此表面有利于MOCVD方法生长高质量InAs/GaSb超晶格红外探测器外延。 | 刘丽杰 赵有文 黄勇 赵宇 王俊 王应利 沈桂英 谢辉 | 2022 | 红外与毫米波学报2022，41，2： | 0 |
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