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| 1 | 阻变存储器研究进展显示文摘阻变存储器(Resistive Random Access Memory,RRAM)是最具应用前景的下一代非易失性存储器之一,与传统浮栅闪存相比在器件结构、速度、可微缩性、三维集成潜力等方面都具有明显的优势,本文对RRAM技术进行了综述.首先简单介绍了阻变存储器的工作原理、技术优势、发展历程和面临的基础科学问题.然后深入总结了RRAM的材料体系,包括固态电解质、多元金属氧化物、二元金属氧化物3类传统的阻变介质材料,总结了纳米线、二维材料等低维纳米材料在RRAM运用方面的近期研究进展,分析了绝缘/导电的低维材料分别用作阻变介质、平面电极层/纳米电极/侧边电极、界面插层所带来的微缩性、阻变性能和稳定性等的改善效果.总结和分析了细丝型电阻转变的3类物理机制:热化学机制(Thermochemical Mechanism,TCM)、电化学金属化(Electrochemical Metallization,ECM)机制、化合价变化机制(Valence Change Mechanism,VCM),详细分析了3种机制的SET/RESET转变原理和基本电学特性、透射电镜观测关键实验验证、对阻变机制的认识发展过程等.在阻变机制分析的基础上,接着阐述了RRAM电阻转变过程中由于纳米尺度下材料微观结构和能带结构的变化导致的一些新奇的物理现象,包括量子效应、磁电效应、光电效应等.最后针对RRAM实现应用的关键——集成技术,总结分析了存储阵列架构、二维/三维集成等关键问题及其研究进展. | 龙世兵 刘琦 吕杭炳 刘明 | 2016 | 中国科学:物理学、力学、天文学2016，46，10： | 11 |
| 2 | An overview of the switching parameter variation of RRAM显示文摘Resistive random access memory(RRAM) has been considered as one of the most promising candidates for next-generation nonvolatile memory, due to its advantages of simple device structure, excellent scalability, fast operation speed and low power consumption. Deeply understanding the physical mechanism and effectively controlling the statistical variation of switching parameters are the basis of fostering RRAM into commercial application. In this paper, based on the deep understanding on the mechanism of the formation and rupture of conductive filament, we summarize the methods of analyzing and modeling the statistics of switching parameters such as SET/RESET voltage, current, speed or time. Then, we analyze the distributions of switching parameters and the influencing factors. Additionally, we also sum up the analytical model of resistive switching statistics composed of the cell-based percolation model and SET/RESET switching dynamics. The results of the model can successfully explain the experimental distributions of switching parameters of the Ni O- and Hf O2-based RRAM devices. The model also provides theoretical guide on how to improve the uniformity and reliability such as disturb immunity. Finally, some experimental approaches to improve the uniformity of switching parameters are discussed. | Meiyun Zhang Shibing Long Guoming Wang Yang Li Xiaoxin Xu Hongtao Liu Ruoyu Liu Ming Wang Congfei Li Pengxiao Sun Haitao Sun Qi Liu Hangbing L Ming Liu | 2014 | Chinese Science Bulletin2014，59，36： | 1 |
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