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1946篇 您的检索式:期刊名="IEEE Transactions on Electron Devices"
    题名 作者 年代 出处 被引量
1A study on the photoresponses in GaAs n-channel optical detectors显示文摘WEI C J KLEIN H J 1982IEEE Transactions on Electron Devices1982,29,9:2
2A nonfundamental theory of low-frequency noise in semiconductor devices 显示文摘Saeed Mohammadi Dimitris Pavlidis 2000IEEE Transactions on Electron Devices2000,47,:2
3High-voltage planar junctions investigated by the OBIC method 显示文摘Stengl R 1987IEEE Transactions on Electron Devices1987,34,4:2
4Determination of the spatial variation of the carrier lifetime in a proton-irradiated Si n+-n-p+diode by optical-beam-induced currrent measurements 显示文摘Flohr T Reinhard H 1990IEEE Transactions on Electron Devices1990,37,9:2
5Room-temperature single-electron memory 显示文摘Yano K Ishii T Hasimoto T Kobayashi F 1994IEEE Transactions on Electron Devices1994,41,9:1
6A shortchannel DC SPICE model for polysilicon thin-film transistors including temperature effects 显示文摘Jacunski M D Shur M S Owusu A A 1999IEEE Transactions on Electron Devices1999,46,6:1
7Efficiency and power density potential of combustion-driven thermophotovoltaic systems using GaSb Photovoltaic Cells显示文摘Zenker M 2001IEEE Transactions on Electron Devices2001,48,2:1
8Characterizations of recessed gate AlGaN/GaN HEMTs on sapphire显示文摘EGAWA T ZHAO G Y ISHIKAWA H 2001IEEE Transactions on Electron Devices2001,48,3:1
9Linearizability of TWT as using predistortion techniques显示文摘Qiu J X 2005IEEE Transactions on Electron Devices2005,52,5:1
10Short-channel effect limitations on high-frequency operation of A1GaN/ GaN HEMTs for T-gate devices 显示文摘Jessen G H Fitch R C Gillespie J K 2007IEEE Transactions on Electron Devices2007,54,10:1
11Remote fiber-optic biosensors based on evanescent-excited fluoro-immunoassay:Concept and progress 显示文摘Andrade J D Vanwagenen R A Gregonis D E 1985IEEE Transactions on Electron Devices1985,32,7:1
12PZT MIM Capacitor With OxygenDoped Ru-Electrodes for Embedded FeRAM Devices显示文摘Naoya Inoue Naoya Furutake Akio Toda Munehiro Tads Yoshihiro Hayashi 2005IEEE Transactions on Electron Device2005,52,:1
13Analytical model for the electric field distribution in SOI resurf and TMBS structures显示文摘Merchant S 1999IEEE Transaction on Electron Devices1999,46,6:1
14Iusulation foe metallic glasses in pulse power system显示文摘Smith C H 1991IEEE Transactions on Electron Devices1991,38,4:1
15High-power recessed-gate AlGaN-GaN HFET with a field-modulating plate显示文摘Yasuhiro Okamoto Yuji Ando Tatsuo Nakayama 2004IEEE Transactions on Electron Devices2004,51,12:1
16Modeling of Carrier Mobility Against Carrier Concentration in Arsenic Boron-doped Silicon显示文摘Masetti G Severi M Solmi S 1983IEEE Transactions on Electronic Devices1983,30,7:1
17A three-step method for the De- Embedding of high-frequency S-parameter measure- ments 显示文摘Cho H Burk D 1991IEEE Transaction on Electron Devices1991,38,6:1
18Analysis of lateral DMOS power devices under ESD stress conditions显示文摘MERGENS M P J WILKENING W METTLER S WOLF H SRICKER A FICHTNER W 2000IEEE Transactions on Electron Devices2000,47,11:1
19Dual material gategraded channel-gate stack surrounding gate MOSFET:analytical threshold voltage and subthreshold swing models显示文摘Aouaj A Bouziane A Nouacry A 2010IEEE Transactions on Electron Devices2010,11,10:1
20Control of threshold voltage of AlGaN/GaN HEMTs by fluoride-based plasma treatment:from depletion mode to enhancement mode显示文摘Cai Y Zhou Y Lau K M 2006IEEE Transactions on Electron Devices2006,53,9:1
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